{"title":"基于微处理器的工业设备质量控制方法","authors":"J. Ruz, A. Bautista","doi":"10.1145/1113549.1113551","DOIUrl":null,"url":null,"abstract":"An industrial devices quality control inspection system based on a general purpose microprocessor is proposed. The system employs a microprocessor CPU, timer, ROM and peripheral interfaces in the hardware portion. Software includes an algorithm incorporating data acquisition, statistical computation and command interpreting functions, plus arithmetic and conversion subroutines. Two applications have been developed and are briefly described.","PeriodicalId":210752,"journal":{"name":"SIGSMALL/PC","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1979-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Microprocessor-based approach to industrial devices quality control\",\"authors\":\"J. Ruz, A. Bautista\",\"doi\":\"10.1145/1113549.1113551\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An industrial devices quality control inspection system based on a general purpose microprocessor is proposed. The system employs a microprocessor CPU, timer, ROM and peripheral interfaces in the hardware portion. Software includes an algorithm incorporating data acquisition, statistical computation and command interpreting functions, plus arithmetic and conversion subroutines. Two applications have been developed and are briefly described.\",\"PeriodicalId\":210752,\"journal\":{\"name\":\"SIGSMALL/PC\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1979-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"SIGSMALL/PC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1113549.1113551\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"SIGSMALL/PC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1113549.1113551","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Microprocessor-based approach to industrial devices quality control
An industrial devices quality control inspection system based on a general purpose microprocessor is proposed. The system employs a microprocessor CPU, timer, ROM and peripheral interfaces in the hardware portion. Software includes an algorithm incorporating data acquisition, statistical computation and command interpreting functions, plus arithmetic and conversion subroutines. Two applications have been developed and are briefly described.
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