{"title":"基于残余缺陷的先验估计的最坏情况可靠性预测","authors":"P. Bishop, R. Bloomfield","doi":"10.1109/ISSRE.2002.1173274","DOIUrl":null,"url":null,"abstract":"In this paper we extend an earlier worst case bound reliability theory to derive a worst case reliability function R(t), which gives the worst case probability of surviving a further time t given an estimate of residual defects in the software N and a prior test time T. The earlier theory and its extension are presented and the paper also considers the case where there is a low probability of any defect existing in the program. For the \"fractional defect\" case, there can be a high probability of surviving any subsequent time t. The implications of the theory are discussed and compared with alternative reliability models.","PeriodicalId":159160,"journal":{"name":"13th International Symposium on Software Reliability Engineering, 2002. Proceedings.","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"Worst case reliability prediction based on a prior estimate of residual defects\",\"authors\":\"P. Bishop, R. Bloomfield\",\"doi\":\"10.1109/ISSRE.2002.1173274\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we extend an earlier worst case bound reliability theory to derive a worst case reliability function R(t), which gives the worst case probability of surviving a further time t given an estimate of residual defects in the software N and a prior test time T. The earlier theory and its extension are presented and the paper also considers the case where there is a low probability of any defect existing in the program. For the \\\"fractional defect\\\" case, there can be a high probability of surviving any subsequent time t. The implications of the theory are discussed and compared with alternative reliability models.\",\"PeriodicalId\":159160,\"journal\":{\"name\":\"13th International Symposium on Software Reliability Engineering, 2002. Proceedings.\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-11-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"13th International Symposium on Software Reliability Engineering, 2002. Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSRE.2002.1173274\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"13th International Symposium on Software Reliability Engineering, 2002. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSRE.2002.1173274","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Worst case reliability prediction based on a prior estimate of residual defects
In this paper we extend an earlier worst case bound reliability theory to derive a worst case reliability function R(t), which gives the worst case probability of surviving a further time t given an estimate of residual defects in the software N and a prior test time T. The earlier theory and its extension are presented and the paper also considers the case where there is a low probability of any defect existing in the program. For the "fractional defect" case, there can be a high probability of surviving any subsequent time t. The implications of the theory are discussed and compared with alternative reliability models.