Sumayya Abbas, T. M. Khan, Salar B. Javaid, Sayed A. Ahmed, S. S. Haider, Zeenat Rajar
{"title":"基于嵌入式硬件的低成本多频涡流检测系统","authors":"Sumayya Abbas, T. M. Khan, Salar B. Javaid, Sayed A. Ahmed, S. S. Haider, Zeenat Rajar","doi":"10.1109/INTELSE.2016.7475175","DOIUrl":null,"url":null,"abstract":"A low cost embedded hardware based multi frequency Eddy Current System has been designed and developed to detect cracks in metallic structures. It includes a constant peak alternating current source capable of operating at multiple frequencies for detecting surface and near sub-surface cracks in metals. Eddy Current Testing probes for different frequency ranges are also designed using the Numerical Approach. The output signal from the probe is demodulated in terms of amplitude and phase. It is then sent to the embedded hardware via a specially designed Data Acquisition (DAQ) card. The test results are plotted in real time and using a Graphical User Interface (GUI), impedance signal is also generated. Multi-frequency data comparison feature is also incorporated.","PeriodicalId":127671,"journal":{"name":"2016 International Conference on Intelligent Systems Engineering (ICISE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Low cost embedded hardware based multi-frequency Eddy Current Testing System\",\"authors\":\"Sumayya Abbas, T. M. Khan, Salar B. Javaid, Sayed A. Ahmed, S. S. Haider, Zeenat Rajar\",\"doi\":\"10.1109/INTELSE.2016.7475175\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A low cost embedded hardware based multi frequency Eddy Current System has been designed and developed to detect cracks in metallic structures. It includes a constant peak alternating current source capable of operating at multiple frequencies for detecting surface and near sub-surface cracks in metals. Eddy Current Testing probes for different frequency ranges are also designed using the Numerical Approach. The output signal from the probe is demodulated in terms of amplitude and phase. It is then sent to the embedded hardware via a specially designed Data Acquisition (DAQ) card. The test results are plotted in real time and using a Graphical User Interface (GUI), impedance signal is also generated. Multi-frequency data comparison feature is also incorporated.\",\"PeriodicalId\":127671,\"journal\":{\"name\":\"2016 International Conference on Intelligent Systems Engineering (ICISE)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Conference on Intelligent Systems Engineering (ICISE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INTELSE.2016.7475175\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Intelligent Systems Engineering (ICISE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INTELSE.2016.7475175","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low cost embedded hardware based multi-frequency Eddy Current Testing System
A low cost embedded hardware based multi frequency Eddy Current System has been designed and developed to detect cracks in metallic structures. It includes a constant peak alternating current source capable of operating at multiple frequencies for detecting surface and near sub-surface cracks in metals. Eddy Current Testing probes for different frequency ranges are also designed using the Numerical Approach. The output signal from the probe is demodulated in terms of amplitude and phase. It is then sent to the embedded hardware via a specially designed Data Acquisition (DAQ) card. The test results are plotted in real time and using a Graphical User Interface (GUI), impedance signal is also generated. Multi-frequency data comparison feature is also incorporated.
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