J. Furuta, C. Hamanaka, Kazutoshi Kobayashi, H. Onodera
{"title":"一种65nm触发器阵列，用于测量对高能中子和α粒子的软错误弹性","authors":"J. Furuta, C. Hamanaka, Kazutoshi Kobayashi, H. Onodera","doi":"10.1109/ASPDAC.2011.5722306","DOIUrl":null,"url":null,"abstract":"We fabricated a 65nm LSI including flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles. It consists of two FF arrays as follows. One is an array composed of redundant FFs to confirm radiation hardness of the proposed and conventional redundant FFs. The other is an array composed of conventional D-FFs to measure SEU (Single Event Upset) and MCU(Multiple Cell Upset) by the distance from tap cells.","PeriodicalId":316253,"journal":{"name":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-01-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"A 65nm flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles\",\"authors\":\"J. Furuta, C. Hamanaka, Kazutoshi Kobayashi, H. Onodera\",\"doi\":\"10.1109/ASPDAC.2011.5722306\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We fabricated a 65nm LSI including flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles. It consists of two FF arrays as follows. One is an array composed of redundant FFs to confirm radiation hardness of the proposed and conventional redundant FFs. The other is an array composed of conventional D-FFs to measure SEU (Single Event Upset) and MCU(Multiple Cell Upset) by the distance from tap cells.\",\"PeriodicalId\":316253,\"journal\":{\"name\":\"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-01-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.2011.5722306\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.2011.5722306","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 65nm flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles
We fabricated a 65nm LSI including flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles. It consists of two FF arrays as follows. One is an array composed of redundant FFs to confirm radiation hardness of the proposed and conventional redundant FFs. The other is an array composed of conventional D-FFs to measure SEU (Single Event Upset) and MCU(Multiple Cell Upset) by the distance from tap cells.
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