干涉测量中的伪影来源

D. Eastman, C. A. Martin
{"title":"干涉测量中的伪影来源","authors":"D. Eastman, C. A. Martin","doi":"10.1364/oft.1980.ffb3","DOIUrl":null,"url":null,"abstract":"Spurious interference effects in interferograms are investigated. These artifacts are caused by ghost reflections, dirt, and diffraction effects. Diagnosis and cures are discussed.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Artifacts Sources In Interferometry\",\"authors\":\"D. Eastman, C. A. Martin\",\"doi\":\"10.1364/oft.1980.ffb3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Spurious interference effects in interferograms are investigated. These artifacts are caused by ghost reflections, dirt, and diffraction effects. Diagnosis and cures are discussed.\",\"PeriodicalId\":170034,\"journal\":{\"name\":\"Workshop on Optical Fabrication and Testing\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Workshop on Optical Fabrication and Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/oft.1980.ffb3\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Workshop on Optical Fabrication and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1980.ffb3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

研究了干涉图中的杂散干涉效应。这些伪影是由鬼影反射、污垢和衍射效应引起的。讨论了诊断和治疗方法。
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Artifacts Sources In Interferometry
Spurious interference effects in interferograms are investigated. These artifacts are caused by ghost reflections, dirt, and diffraction effects. Diagnosis and cures are discussed.
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