探索冗余技术以提高基于pcm的主存的寿命

Jie Chen, Zachary Winter, Guru Venkataramani, H. H. Huang
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引用次数: 7

摘要

未来的主存储系统将面临DRAM技术带来的扩展挑战,并应适应新兴的存储技术,如相变存储器(PCM,或PRAM)。PCM具有诸如存储密度、非易失性和较低能耗等优点。然而,它们受到写入持久性有限和性能降低的限制。在本文中,我们提出了一种新的基于PCM的主存储系统,rPRAM,它探索了先进的冗余技术来恢复故障的PCM页面并重用这些页面来存储数据。我们的初步实验表明,rPRAM有可能延长基于PCM的存储器的寿命,与现有方案(如ECP)相当,而与ECP相比,其硬件成本仅为微不足道的一小部分。
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rPRAM: Exploring Redundancy Techniques to Improve Lifetime of PCM-based Main Memory
Future main memory systems will confront the scaling challenges posed by DRAM technology and should adapt themselves to use the emerging memory technologies like Phase Change Memory (PCM, or PRAM). PCM offers advantages such as storage density, non-volatility, and lower energy consumption. However, they are constrained by limited write endurance and reduced performance. In this paper, we propose a novel PCM-based main memory system, rPRAM, that explores advanced redundancy techniques to resuscitate faulty PCM pages and reuse these pages to store data. Our preliminary experiments show that rPRAM has the potential to extend the lifetime of PCM based memory commensurate with the existing schemes like ECP, while incurring only a negligible fraction of hardware cost compared to ECP.
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