被测设备周围连续测量的快速磁发射试验

Tom Hartman, N. Moonen, Bas ten Have, F. Leferink
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引用次数: 4

摘要

为了评估被测设备(EUT)的辐射电磁干扰(EMI)发射,传统上选择在EUT周围的有限数量的位置。这是由于EMI测试接收机每个位置的测量时间很长,尽管时域电磁干扰(TDEMI)分析仪的引入已经大大减少了测量时间。然而,在EUT周围有限的测量位置意味着在EUT周围的某些位置可能会错过最大干扰,从而造成对最大发射的低估。本文利用低成本的基带数字化仪实现了EUT周围的连续位置测量。该测量通过考虑EUT周围的每个位置来表示干扰的最大发射。
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Fast Magnetic Emission Tests for Continuous Measurements Around an Equipment Under Test
For the assessment of radiated electromagnetic interference (EMI) emission of an equipment under test (EUT) traditionally a limited amount of positions around the EUT are chosen. This is due to the long measurement time per position of the EMI test receiver, although the introduction of time domain electromagnetic interference (TDEMI) analyzers already created serious reduction in measurement time. The limited amount of measurement positions around an EUT means however that the maximum interference can be missed at certain positions around the EUT, creating an underestimation of the maximum emission. With the use of a low cost baseband digitizer this paper realizes a continuous positional measurement around an EUT. This measurement presents the maximum emission of the interference by considering every position around the EUT.
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