{"title":"Exposure-resilient萃取器","authors":"Marius Zimand","doi":"10.1109/CCC.2006.19","DOIUrl":null,"url":null,"abstract":"An exposure-resilient extractor is an efficient procedure that, from a random variable with imperfect min-entropy, produces randomness that passes all statistical tests including those that have bounded access to the random variable, with adaptive queries that can depend on the string being tested. More precisely, EXT : {0, 1}n times {0, 1}d rarr {0, 1}m is a (k, epsi)-exposure resilient extractor resistant to q queries if, when the min-entropy of x is at least k and y is random, EXT(x, y) looks epsi-random to all statistical tests modeled by oracle circuits of unbounded complexity that can query q bits of x. We construct, for any delta < 1, a(k, epsi)-exposure resilient extractor with query resistance ndelta, k = n - nOmega(1), epsi = n-Omega(1), m = nOmega(1) and d = O(log n)","PeriodicalId":325664,"journal":{"name":"21st Annual IEEE Conference on Computational Complexity (CCC'06)","volume":"134 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Exposure-resilient extractors\",\"authors\":\"Marius Zimand\",\"doi\":\"10.1109/CCC.2006.19\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An exposure-resilient extractor is an efficient procedure that, from a random variable with imperfect min-entropy, produces randomness that passes all statistical tests including those that have bounded access to the random variable, with adaptive queries that can depend on the string being tested. More precisely, EXT : {0, 1}n times {0, 1}d rarr {0, 1}m is a (k, epsi)-exposure resilient extractor resistant to q queries if, when the min-entropy of x is at least k and y is random, EXT(x, y) looks epsi-random to all statistical tests modeled by oracle circuits of unbounded complexity that can query q bits of x. We construct, for any delta < 1, a(k, epsi)-exposure resilient extractor with query resistance ndelta, k = n - nOmega(1), epsi = n-Omega(1), m = nOmega(1) and d = O(log n)\",\"PeriodicalId\":325664,\"journal\":{\"name\":\"21st Annual IEEE Conference on Computational Complexity (CCC'06)\",\"volume\":\"134 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-07-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"21st Annual IEEE Conference on Computational Complexity (CCC'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCC.2006.19\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st Annual IEEE Conference on Computational Complexity (CCC'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCC.2006.19","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
摘要
暴露弹性提取器是一种有效的程序,它从具有不完美最小熵的随机变量中产生通过所有统计测试的随机性,包括那些对随机变量有有限访问的随机性,并具有可依赖于被测试字符串的自适应查询。更准确地说,EXT: {0,1} n次{0,1}d rarr {0,1} m是一个(k, epsi)接触弹性器耐问查询,如果当x至少是k的最小熵和y是随机的,EXT (x, y)看起来epsi-random所有统计测试建模通过甲骨文无限复杂的电路,可以查询问x。我们构造,对于任何三角洲< 1,(k, epsi)接触弹性与查询器阻力ndelta, k = n - nOmega (1), epsi =ω(1),m = nOmega(1)和d = O (log n)
An exposure-resilient extractor is an efficient procedure that, from a random variable with imperfect min-entropy, produces randomness that passes all statistical tests including those that have bounded access to the random variable, with adaptive queries that can depend on the string being tested. More precisely, EXT : {0, 1}n times {0, 1}d rarr {0, 1}m is a (k, epsi)-exposure resilient extractor resistant to q queries if, when the min-entropy of x is at least k and y is random, EXT(x, y) looks epsi-random to all statistical tests modeled by oracle circuits of unbounded complexity that can query q bits of x. We construct, for any delta < 1, a(k, epsi)-exposure resilient extractor with query resistance ndelta, k = n - nOmega(1), epsi = n-Omega(1), m = nOmega(1) and d = O(log n)