{"title":"短电脉冲激励下横结条纹激光器的横向模态特性","authors":"K. Lau, A. Yariv","doi":"10.1109/IEDM.1980.189839","DOIUrl":null,"url":null,"abstract":"The transverse modal behavior of the transverse junction stripe (TJS) laser excited by short (70 ps) electrical pulse is investigated experimentally and theoretically, It is predicted theoretically and observed experimentally that the transverse mode strongly depends on the excitation pulse amplitude and the dc bias current (which is set below threshold), This dependence is found to be due to transient lateral carrier diffusion at the lasing junction.","PeriodicalId":180541,"journal":{"name":"1980 International Electron Devices Meeting","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Transverse modal behavior of transverse junction stripe laser excited by short electrical pulse\",\"authors\":\"K. Lau, A. Yariv\",\"doi\":\"10.1109/IEDM.1980.189839\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The transverse modal behavior of the transverse junction stripe (TJS) laser excited by short (70 ps) electrical pulse is investigated experimentally and theoretically, It is predicted theoretically and observed experimentally that the transverse mode strongly depends on the excitation pulse amplitude and the dc bias current (which is set below threshold), This dependence is found to be due to transient lateral carrier diffusion at the lasing junction.\",\"PeriodicalId\":180541,\"journal\":{\"name\":\"1980 International Electron Devices Meeting\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1980-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1980 International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1980.189839\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1980 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1980.189839","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transverse modal behavior of transverse junction stripe laser excited by short electrical pulse
The transverse modal behavior of the transverse junction stripe (TJS) laser excited by short (70 ps) electrical pulse is investigated experimentally and theoretically, It is predicted theoretically and observed experimentally that the transverse mode strongly depends on the excitation pulse amplitude and the dc bias current (which is set below threshold), This dependence is found to be due to transient lateral carrier diffusion at the lasing junction.
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