{"title":"多端口放大器隔离性能的统计特性:一个关键的讨论","authors":"M. Aloisio, P. Angeletti, S. D'addio","doi":"10.1109/IVEC.2011.5746886","DOIUrl":null,"url":null,"abstract":"In this paper, statistical techniques for the determination of Isolation Performance of Multiport Amplifiers are described and their critical comparison is discussed. Different approaches are considered and their results are compared from an end user perspective.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"109 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Statistical characterization of Isolation Performance of Multiport Amplifiers: A critical discussion\",\"authors\":\"M. Aloisio, P. Angeletti, S. D'addio\",\"doi\":\"10.1109/IVEC.2011.5746886\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, statistical techniques for the determination of Isolation Performance of Multiport Amplifiers are described and their critical comparison is discussed. Different approaches are considered and their results are compared from an end user perspective.\",\"PeriodicalId\":106174,\"journal\":{\"name\":\"2011 IEEE International Vacuum Electronics Conference (IVEC)\",\"volume\":\"109 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-02-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE International Vacuum Electronics Conference (IVEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVEC.2011.5746886\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Vacuum Electronics Conference (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2011.5746886","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Statistical characterization of Isolation Performance of Multiport Amplifiers: A critical discussion
In this paper, statistical techniques for the determination of Isolation Performance of Multiport Amplifiers are described and their critical comparison is discussed. Different approaches are considered and their results are compared from an end user perspective.
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