{"title":"电磁干扰测量用磁探头的研究","authors":"Ming-Shing Lin, Cyuan-Min He, C. G. Hsu","doi":"10.1109/APEMC.2015.7175309","DOIUrl":null,"url":null,"abstract":"In this study, four H-field probes having different feeding structures, including a strip line, a microstrip line, a coplanar waveguide (CPW), and a conductor-backed CPW (CB-CPW), were investigated and compared. The sensitivity, calibration factor, E-field isolation, and spatial resolution of the magnetic probes were calculated and evaluated. It was found that all these probes can be used to measure the near-field radiation from and the RF current in an IC pin or a trace on a printed-circuit board (PCB).","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Study of magnetic probes used in EMI measurements\",\"authors\":\"Ming-Shing Lin, Cyuan-Min He, C. G. Hsu\",\"doi\":\"10.1109/APEMC.2015.7175309\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this study, four H-field probes having different feeding structures, including a strip line, a microstrip line, a coplanar waveguide (CPW), and a conductor-backed CPW (CB-CPW), were investigated and compared. The sensitivity, calibration factor, E-field isolation, and spatial resolution of the magnetic probes were calculated and evaluated. It was found that all these probes can be used to measure the near-field radiation from and the RF current in an IC pin or a trace on a printed-circuit board (PCB).\",\"PeriodicalId\":325138,\"journal\":{\"name\":\"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEMC.2015.7175309\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2015.7175309","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this study, four H-field probes having different feeding structures, including a strip line, a microstrip line, a coplanar waveguide (CPW), and a conductor-backed CPW (CB-CPW), were investigated and compared. The sensitivity, calibration factor, E-field isolation, and spatial resolution of the magnetic probes were calculated and evaluated. It was found that all these probes can be used to measure the near-field radiation from and the RF current in an IC pin or a trace on a printed-circuit board (PCB).
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