{"title":"光束光学分析仪中细胞内粒子的时间分析","authors":"T. Bui, M. Read, L. Ives","doi":"10.1109/IVEC.2011.5746934","DOIUrl":null,"url":null,"abstract":"This paper will describe the new feature, temporal particle-in-cell analysis in Beam Optics Analyzer in detail. Algorithms for pushing particles and field solution will be discussed. Numerical results for a diode as well as a gridded electron gun will demonstrate the implementation.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Temporal particle-in-cell analysis in Beam Optics Analyzer\",\"authors\":\"T. Bui, M. Read, L. Ives\",\"doi\":\"10.1109/IVEC.2011.5746934\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper will describe the new feature, temporal particle-in-cell analysis in Beam Optics Analyzer in detail. Algorithms for pushing particles and field solution will be discussed. Numerical results for a diode as well as a gridded electron gun will demonstrate the implementation.\",\"PeriodicalId\":106174,\"journal\":{\"name\":\"2011 IEEE International Vacuum Electronics Conference (IVEC)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-02-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE International Vacuum Electronics Conference (IVEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVEC.2011.5746934\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Vacuum Electronics Conference (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2011.5746934","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Temporal particle-in-cell analysis in Beam Optics Analyzer
This paper will describe the new feature, temporal particle-in-cell analysis in Beam Optics Analyzer in detail. Algorithms for pushing particles and field solution will be discussed. Numerical results for a diode as well as a gridded electron gun will demonstrate the implementation.
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