{"title":"多集成电路源的辐射-发射影响","authors":"Val L. Erwin, K. Fischer","doi":"10.1109/ISEMC.1985.7566913","DOIUrl":null,"url":null,"abstract":"An unaccep tab le increase in the rad ia ted emissions am plitudes of an e lectron ic d a ta processing product was a ttr ib u ted to m ultiple in teg ra ted -c ircu it (IC) sourcing. Conducted w aveform s genera ted by these devices on the data /add ress bus w ere m easured in the tim e domain. Emissions rad ia ted from various IC sources w ere m easured in the frequency domain a t an open-field te s t site . Interchanging ICs, even though of a sam e device type, had a significant im pact upon th e EMC profile.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Radiated-Emission Ramifications of Multiple IC Sourcing\",\"authors\":\"Val L. Erwin, K. Fischer\",\"doi\":\"10.1109/ISEMC.1985.7566913\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An unaccep tab le increase in the rad ia ted emissions am plitudes of an e lectron ic d a ta processing product was a ttr ib u ted to m ultiple in teg ra ted -c ircu it (IC) sourcing. Conducted w aveform s genera ted by these devices on the data /add ress bus w ere m easured in the tim e domain. Emissions rad ia ted from various IC sources w ere m easured in the frequency domain a t an open-field te s t site . Interchanging ICs, even though of a sam e device type, had a significant im pact upon th e EMC profile.\",\"PeriodicalId\":256770,\"journal\":{\"name\":\"1985 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1985-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1985 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1985.7566913\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1985 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1985.7566913","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Radiated-Emission Ramifications of Multiple IC Sourcing
An unaccep tab le increase in the rad ia ted emissions am plitudes of an e lectron ic d a ta processing product was a ttr ib u ted to m ultiple in teg ra ted -c ircu it (IC) sourcing. Conducted w aveform s genera ted by these devices on the data /add ress bus w ere m easured in the tim e domain. Emissions rad ia ted from various IC sources w ere m easured in the frequency domain a t an open-field te s t site . Interchanging ICs, even though of a sam e device type, had a significant im pact upon th e EMC profile.
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