{"title":"激光太赫兹发射纳米显微镜","authors":"A. Pizzuto, P. Klarskov, D. Mittleman","doi":"10.1364/CLEOPR.2018.TU3C.2","DOIUrl":null,"url":null,"abstract":"We demonstrate depletion of terahertz emission from semiconductors by applying a DC bias between a substrate and an AFM probe operating in tapping mode. The depletion is strongly dependent on the probe tapping amplitude.","PeriodicalId":184212,"journal":{"name":"2018 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Laser Terahertz Emission Nanoscopy\",\"authors\":\"A. Pizzuto, P. Klarskov, D. Mittleman\",\"doi\":\"10.1364/CLEOPR.2018.TU3C.2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We demonstrate depletion of terahertz emission from semiconductors by applying a DC bias between a substrate and an AFM probe operating in tapping mode. The depletion is strongly dependent on the probe tapping amplitude.\",\"PeriodicalId\":184212,\"journal\":{\"name\":\"2018 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/CLEOPR.2018.TU3C.2\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/CLEOPR.2018.TU3C.2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We demonstrate depletion of terahertz emission from semiconductors by applying a DC bias between a substrate and an AFM probe operating in tapping mode. The depletion is strongly dependent on the probe tapping amplitude.
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