用于高速多级电压检测器的动态阈值电压CNTFET性能分析

S. Bari, Subrata Biswas, A. Arifuzzman, Habib Muhammad Nazir Ahmad, N. Hasan
{"title":"用于高速多级电压检测器的动态阈值电压CNTFET性能分析","authors":"S. Bari, Subrata Biswas, A. Arifuzzman, Habib Muhammad Nazir Ahmad, N. Hasan","doi":"10.1109/UKSim.2012.98","DOIUrl":null,"url":null,"abstract":"The main objective of this paper is to design a novel threshold voltage detector circuit using carbon nanotube field effect transistor (CNTFET). This circuit is simulated in HSPICE by using HSPICE model of CNTFET. The uniqueness of this proposed circuit is that the threshold voltage of each CNTFET decides each voltage detection level where as in CMOS implementation a complex band-gap reference circuit is needed to produce a reference voltage level for precise detection. MOSFETs with different threshold voltage can also be used to implement this idea but that would add a new Vth mask for each different voltage detection level which will increase the process cost significantly. Therefore this new proposed CNTFET based voltage level detection circuit can produce much improved performance with significant reduction in implementation complexity by both saving number of mask set and reducing the chip area significantly.","PeriodicalId":405479,"journal":{"name":"2012 UKSim 14th International Conference on Computer Modelling and Simulation","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2012-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Performance Analysis of Dynamic Threshold-Voltage CNTFET for High-Speed Multi-level Voltage Detector\",\"authors\":\"S. Bari, Subrata Biswas, A. Arifuzzman, Habib Muhammad Nazir Ahmad, N. Hasan\",\"doi\":\"10.1109/UKSim.2012.98\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The main objective of this paper is to design a novel threshold voltage detector circuit using carbon nanotube field effect transistor (CNTFET). This circuit is simulated in HSPICE by using HSPICE model of CNTFET. The uniqueness of this proposed circuit is that the threshold voltage of each CNTFET decides each voltage detection level where as in CMOS implementation a complex band-gap reference circuit is needed to produce a reference voltage level for precise detection. MOSFETs with different threshold voltage can also be used to implement this idea but that would add a new Vth mask for each different voltage detection level which will increase the process cost significantly. Therefore this new proposed CNTFET based voltage level detection circuit can produce much improved performance with significant reduction in implementation complexity by both saving number of mask set and reducing the chip area significantly.\",\"PeriodicalId\":405479,\"journal\":{\"name\":\"2012 UKSim 14th International Conference on Computer Modelling and Simulation\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-03-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 UKSim 14th International Conference on Computer Modelling and Simulation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/UKSim.2012.98\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 UKSim 14th International Conference on Computer Modelling and Simulation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/UKSim.2012.98","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

本文的主要目的是利用碳纳米管场效应晶体管(CNTFET)设计一种新的阈值电压检测器电路。利用CNTFET的HSPICE模型在HSPICE中对该电路进行了仿真。该电路的独特之处在于每个CNTFET的阈值电压决定每个电压检测电平,而在CMOS实现中,需要一个复杂的带隙参考电路来产生精确检测的参考电压电平。具有不同阈值电压的mosfet也可用于实现此想法,但这将为每个不同的电压检测电平添加新的Vth掩模,这将显着增加工艺成本。因此,本文提出的基于CNTFET的电压电平检测电路在节省掩模集数量和显著减小芯片面积的同时,显著降低了实现复杂度,从而大大提高了电路的性能。
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Performance Analysis of Dynamic Threshold-Voltage CNTFET for High-Speed Multi-level Voltage Detector
The main objective of this paper is to design a novel threshold voltage detector circuit using carbon nanotube field effect transistor (CNTFET). This circuit is simulated in HSPICE by using HSPICE model of CNTFET. The uniqueness of this proposed circuit is that the threshold voltage of each CNTFET decides each voltage detection level where as in CMOS implementation a complex band-gap reference circuit is needed to produce a reference voltage level for precise detection. MOSFETs with different threshold voltage can also be used to implement this idea but that would add a new Vth mask for each different voltage detection level which will increase the process cost significantly. Therefore this new proposed CNTFET based voltage level detection circuit can produce much improved performance with significant reduction in implementation complexity by both saving number of mask set and reducing the chip area significantly.
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