{"title":"机器学习,优化和数据科学:第六届国际会议,LOD 2020,锡耶纳,意大利,2020年7月19-23日,修订论文选集,第二部分","authors":"M. Odio","doi":"10.1007/978-3-030-64580-9","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":131249,"journal":{"name":"Machine Learning, Optimization, and Data Science","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-01-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Machine Learning, Optimization, and Data Science: 6th International Conference, LOD 2020, Siena, Italy, July 19–23, 2020, Revised Selected Papers, Part II\",\"authors\":\"M. Odio\",\"doi\":\"10.1007/978-3-030-64580-9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":131249,\"journal\":{\"name\":\"Machine Learning, Optimization, and Data Science\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-01-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Machine Learning, Optimization, and Data Science\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-3-030-64580-9\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Machine Learning, Optimization, and Data Science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-64580-9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Machine Learning, Optimization, and Data Science: 6th International Conference, LOD 2020, Siena, Italy, July 19–23, 2020, Revised Selected Papers, Part II