{"title":"高级合成AES电路功率侧漏的实证分析","authors":"Takumi Mizuno, Hiroki Nishikawa, Xiangbo Kong, Hiroyuki Tomiyama","doi":"10.11591/ijres.v12.i3.pp305-319","DOIUrl":null,"url":null,"abstract":"Many internet of things (IoT) devices and integrated circuit (IC) cards have been compromised by side-channel attacks. Power-analysis attacks, which identify the secret key of a cryptographic circuit by analyzing the power traces, are among the most dangerous side-channel attacks. Gen-erally, there is a trade-off between execution time and circuit area. However, the correlation between security and performance has yet to be determined. In this study, we investigate the cor-relation between side-channel attack resistance and performance (execution time and circuit area) of advanced encryption standard (AES) circuits. Eleven AES circuits with different performances are designed by high-level synthesis and logic synthesis. Of the eleven AES circuits, six are circuits with no side-channel attack countermeasures and five are circuits with masking countermeasures. We employ four metrics based on a T-test to evaluate the side-channel attack resistance. The results based on the correlation coefficient show the correlation between side-channel attack resistance and performance. The correlation varies according to four metrics or masking countermeasure. We argue that designers should change their attitudes towards circuit design when considering security.","PeriodicalId":158991,"journal":{"name":"International Journal of Reconfigurable and Embedded Systems (IJRES)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Empirical analysis of power side-channel leakage of high-level synthesis designed AES circuits\",\"authors\":\"Takumi Mizuno, Hiroki Nishikawa, Xiangbo Kong, Hiroyuki Tomiyama\",\"doi\":\"10.11591/ijres.v12.i3.pp305-319\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Many internet of things (IoT) devices and integrated circuit (IC) cards have been compromised by side-channel attacks. Power-analysis attacks, which identify the secret key of a cryptographic circuit by analyzing the power traces, are among the most dangerous side-channel attacks. Gen-erally, there is a trade-off between execution time and circuit area. However, the correlation between security and performance has yet to be determined. In this study, we investigate the cor-relation between side-channel attack resistance and performance (execution time and circuit area) of advanced encryption standard (AES) circuits. Eleven AES circuits with different performances are designed by high-level synthesis and logic synthesis. Of the eleven AES circuits, six are circuits with no side-channel attack countermeasures and five are circuits with masking countermeasures. We employ four metrics based on a T-test to evaluate the side-channel attack resistance. The results based on the correlation coefficient show the correlation between side-channel attack resistance and performance. The correlation varies according to four metrics or masking countermeasure. We argue that designers should change their attitudes towards circuit design when considering security.\",\"PeriodicalId\":158991,\"journal\":{\"name\":\"International Journal of Reconfigurable and Embedded Systems (IJRES)\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Reconfigurable and Embedded Systems (IJRES)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.11591/ijres.v12.i3.pp305-319\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Reconfigurable and Embedded Systems (IJRES)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.11591/ijres.v12.i3.pp305-319","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Empirical analysis of power side-channel leakage of high-level synthesis designed AES circuits
Many internet of things (IoT) devices and integrated circuit (IC) cards have been compromised by side-channel attacks. Power-analysis attacks, which identify the secret key of a cryptographic circuit by analyzing the power traces, are among the most dangerous side-channel attacks. Gen-erally, there is a trade-off between execution time and circuit area. However, the correlation between security and performance has yet to be determined. In this study, we investigate the cor-relation between side-channel attack resistance and performance (execution time and circuit area) of advanced encryption standard (AES) circuits. Eleven AES circuits with different performances are designed by high-level synthesis and logic synthesis. Of the eleven AES circuits, six are circuits with no side-channel attack countermeasures and five are circuits with masking countermeasures. We employ four metrics based on a T-test to evaluate the side-channel attack resistance. The results based on the correlation coefficient show the correlation between side-channel attack resistance and performance. The correlation varies according to four metrics or masking countermeasure. We argue that designers should change their attitudes towards circuit design when considering security.