{"title":"高双折射双模光纤应变测量的傅立叶分析","authors":"T. Wolinski, M. Muszkowski","doi":"10.1109/IMTC.1994.351797","DOIUrl":null,"url":null,"abstract":"A new approach to strain measurement based on Fourier analysis of strain-induced polarization and intermodal coupling in HB two-mode elliptical-core fibers is presented. We have applied the Fourier method to analyze different types of polarization and intermodal couplings occurring in a highly birefringent elliptical-core fiber (UMCS, Lublin). The results obtained indicate that Fourier spectra of sin-like strain-dependent characteristics can create a very important tool in projecting practical devices which will measure longitudinal strain in specific applications.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Fourier analysis of strain measurement using highly birefringent two-mode optical fibers\",\"authors\":\"T. Wolinski, M. Muszkowski\",\"doi\":\"10.1109/IMTC.1994.351797\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new approach to strain measurement based on Fourier analysis of strain-induced polarization and intermodal coupling in HB two-mode elliptical-core fibers is presented. We have applied the Fourier method to analyze different types of polarization and intermodal couplings occurring in a highly birefringent elliptical-core fiber (UMCS, Lublin). The results obtained indicate that Fourier spectra of sin-like strain-dependent characteristics can create a very important tool in projecting practical devices which will measure longitudinal strain in specific applications.<<ETX>>\",\"PeriodicalId\":231484,\"journal\":{\"name\":\"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-05-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1994.351797\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1994.351797","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fourier analysis of strain measurement using highly birefringent two-mode optical fibers
A new approach to strain measurement based on Fourier analysis of strain-induced polarization and intermodal coupling in HB two-mode elliptical-core fibers is presented. We have applied the Fourier method to analyze different types of polarization and intermodal couplings occurring in a highly birefringent elliptical-core fiber (UMCS, Lublin). The results obtained indicate that Fourier spectra of sin-like strain-dependent characteristics can create a very important tool in projecting practical devices which will measure longitudinal strain in specific applications.<>