S. Kim, Dongkwun Kim, Ayushparth Sharma, Mingoo Seok
{"title":"EQZ-LDO:近零EDP开销,> 10m攻击弹性,安全数字LDO,具有攻击检测和检测驱动保护功能,适用于相关功率分析弹性物联网设备","authors":"S. Kim, Dongkwun Kim, Ayushparth Sharma, Mingoo Seok","doi":"10.23919/VLSICircuits52068.2021.9492345","DOIUrl":null,"url":null,"abstract":"This paper presents EQZ-LDO, a digital low drop-out regulator (LDO) with attack detection and detection-driven protection for side-channel attack (SCA) resiliency. It typically incurs only 0.5% energy-delay-product (EDP) overhead since the proposed detection-driven scheme exercises protection only when the AES is under attack. This enables to amortize the EDP overhead over the lifetime of an Internet of Things (IoT) device. It still achieves very strong resiliency to SCA, demonstrating the protection of a 128b AES core from >10M-trace correlation power analysis (CPA).","PeriodicalId":106356,"journal":{"name":"2021 Symposium on VLSI Circuits","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"EQZ-LDO: A Near-Zero EDP Overhead, >10M-Attack-Resilient, Secure Digital LDO featuring Attack-Detection and Detection-Driven Protection for a Correlation-Power-Analysis-Resilient IoT Device\",\"authors\":\"S. Kim, Dongkwun Kim, Ayushparth Sharma, Mingoo Seok\",\"doi\":\"10.23919/VLSICircuits52068.2021.9492345\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents EQZ-LDO, a digital low drop-out regulator (LDO) with attack detection and detection-driven protection for side-channel attack (SCA) resiliency. It typically incurs only 0.5% energy-delay-product (EDP) overhead since the proposed detection-driven scheme exercises protection only when the AES is under attack. This enables to amortize the EDP overhead over the lifetime of an Internet of Things (IoT) device. It still achieves very strong resiliency to SCA, demonstrating the protection of a 128b AES core from >10M-trace correlation power analysis (CPA).\",\"PeriodicalId\":106356,\"journal\":{\"name\":\"2021 Symposium on VLSI Circuits\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 Symposium on VLSI Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/VLSICircuits52068.2021.9492345\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/VLSICircuits52068.2021.9492345","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
EQZ-LDO: A Near-Zero EDP Overhead, >10M-Attack-Resilient, Secure Digital LDO featuring Attack-Detection and Detection-Driven Protection for a Correlation-Power-Analysis-Resilient IoT Device
This paper presents EQZ-LDO, a digital low drop-out regulator (LDO) with attack detection and detection-driven protection for side-channel attack (SCA) resiliency. It typically incurs only 0.5% energy-delay-product (EDP) overhead since the proposed detection-driven scheme exercises protection only when the AES is under attack. This enables to amortize the EDP overhead over the lifetime of an Internet of Things (IoT) device. It still achieves very strong resiliency to SCA, demonstrating the protection of a 128b AES core from >10M-trace correlation power analysis (CPA).