低功耗,低存储开销的芯片kill通过多行纠错纠正

Xun Jian, Henry Duwe, J. Sartori, Vilas Sridharan, Rakesh Kumar
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引用次数: 50

摘要

由于它们的大内存容量,许多现代服务器需要chipkill correct,一种先进的内存错误检测和纠正,以满足它们的可靠性要求。然而,现有的芯片kill-correct解决方案会导致较高的功耗或存储开销,或者两者兼而有之,因为它们对每个码字使用专用的纠错资源来执行纠错。这需要很高的纠错开销,并导致很高的错误检测开销。我们提出了一种新的芯片杀伤-纠错解决方案,即多行纠错,它利用内存中多行共享的资源进行纠错,以减少错误检测和纠错的开销。我们的评估表明,与商业解决方案相比,提议的解决方案平均降低了27%的内存功耗,最多可降低38%,而存储开销仅增加0.4%,对可靠性的影响最小。
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Low-power, low-storage-overhead chipkill correct via multi-line error correction
Due to their large memory capacities, many modern servers require chipkill correct, an advanced type of memory error detection and correction, to meet their reliability requirements. However, existing chipkill-correct solutions incur high power or storage overheads, or both because they use dedicated error-correction resources per codeword to perform error correction. This requires high overhead for correction and results in high overhead for error detection. We propose a novel chipkill-correct solution, multi-line error correction, that uses resources shared across multiple lines in memory for error correction to reduce the overhead of both error detection and correction. Our evaluations show that the proposed solution reduces memory power by a mean of 27%, and up to 38% with respect to commercial solutions, at a cost of 0.4% increase in storage overhead and minimal impact on reliability.
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