电子产品的腐蚀

{"title":"电子产品的腐蚀","authors":"U. Naresh, N. S. Kumar, K. Naidu, B. Reddy, A. Manohar, M. A. Kumar, T. A. Babu","doi":"10.2174/9789811481833121010005","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":200893,"journal":{"name":"Corrosion Science: Modern Trends and Applications","volume":"192 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Corrosion in Electronics\",\"authors\":\"U. Naresh, N. S. Kumar, K. Naidu, B. Reddy, A. Manohar, M. A. Kumar, T. A. Babu\",\"doi\":\"10.2174/9789811481833121010005\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":200893,\"journal\":{\"name\":\"Corrosion Science: Modern Trends and Applications\",\"volume\":\"192 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Corrosion Science: Modern Trends and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2174/9789811481833121010005\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Corrosion Science: Modern Trends and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2174/9789811481833121010005","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}