{"title":"利用光纤参量放大器进行高分辨率光波形采样","authors":"P. Andrekson, M. Westlund, H. Sunnerud","doi":"10.1109/LEOSWT.2008.4444396","DOIUrl":null,"url":null,"abstract":"Techniques to analyze optical waveforms with high resolution are discussed. Emphasis is on all-optical sampling using FOP As that offer high resolution with excellent sensitivity.","PeriodicalId":114191,"journal":{"name":"2008 IEEE/LEOS Winter Topical Meeting Series","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"High resolution optical waveform sampling using fiber-optic parametric amplifiers\",\"authors\":\"P. Andrekson, M. Westlund, H. Sunnerud\",\"doi\":\"10.1109/LEOSWT.2008.4444396\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Techniques to analyze optical waveforms with high resolution are discussed. Emphasis is on all-optical sampling using FOP As that offer high resolution with excellent sensitivity.\",\"PeriodicalId\":114191,\"journal\":{\"name\":\"2008 IEEE/LEOS Winter Topical Meeting Series\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-01-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE/LEOS Winter Topical Meeting Series\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LEOSWT.2008.4444396\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE/LEOS Winter Topical Meeting Series","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LEOSWT.2008.4444396","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High resolution optical waveform sampling using fiber-optic parametric amplifiers
Techniques to analyze optical waveforms with high resolution are discussed. Emphasis is on all-optical sampling using FOP As that offer high resolution with excellent sensitivity.
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