{"title":"用检查对可重新进入的制造系统建模","authors":"Y. Narahari, L. Khan","doi":"10.1109/ROBOT.1995.525523","DOIUrl":null,"url":null,"abstract":"Inspection stations are now an integral part of any manufacturing system and help track product quality and process performance. In this paper the authors consider re-entrant manufacturing systems (such as semiconductor fabrication facilities) with inspections at various stages of processing. At the end of each inspection, three possibilities are assumed, namely accept, reject, or rework at some previous stage. The authors propose re-entrant lines with probabilistic routing as models for such systems and present an efficient analytical technique based on mean value analysis to predict mean cycle times and throughput rates. The method can be used to compare different ways of locating inspection stations, from a cycle time and throughput viewpoint.","PeriodicalId":432931,"journal":{"name":"Proceedings of 1995 IEEE International Conference on Robotics and Automation","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Modeling re-entrant manufacturing systems with inspections\",\"authors\":\"Y. Narahari, L. Khan\",\"doi\":\"10.1109/ROBOT.1995.525523\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Inspection stations are now an integral part of any manufacturing system and help track product quality and process performance. In this paper the authors consider re-entrant manufacturing systems (such as semiconductor fabrication facilities) with inspections at various stages of processing. At the end of each inspection, three possibilities are assumed, namely accept, reject, or rework at some previous stage. The authors propose re-entrant lines with probabilistic routing as models for such systems and present an efficient analytical technique based on mean value analysis to predict mean cycle times and throughput rates. The method can be used to compare different ways of locating inspection stations, from a cycle time and throughput viewpoint.\",\"PeriodicalId\":432931,\"journal\":{\"name\":\"Proceedings of 1995 IEEE International Conference on Robotics and Automation\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1995 IEEE International Conference on Robotics and Automation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ROBOT.1995.525523\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1995 IEEE International Conference on Robotics and Automation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ROBOT.1995.525523","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling re-entrant manufacturing systems with inspections
Inspection stations are now an integral part of any manufacturing system and help track product quality and process performance. In this paper the authors consider re-entrant manufacturing systems (such as semiconductor fabrication facilities) with inspections at various stages of processing. At the end of each inspection, three possibilities are assumed, namely accept, reject, or rework at some previous stage. The authors propose re-entrant lines with probabilistic routing as models for such systems and present an efficient analytical technique based on mean value analysis to predict mean cycle times and throughput rates. The method can be used to compare different ways of locating inspection stations, from a cycle time and throughput viewpoint.