LA-LRU:一种延迟感知的容差缓存替换策略

Aarul Jain, Aviral Shrivastava, C. Chakrabarti
{"title":"LA-LRU:一种延迟感知的容差缓存替换策略","authors":"Aarul Jain, Aviral Shrivastava, C. Chakrabarti","doi":"10.1109/VLSID.2011.24","DOIUrl":null,"url":null,"abstract":"Parameter variations in deep sub-micron integrated circuits cause chip characteristics to deviate during semiconductor fabrication process. These variations are dominant in memory systems such as caches and the delay spread due to process variation impacts the performance of a cache based system significantly. In this paper, we propose two schemes to reduce the performance impact of variations in caches: i) Latency-Aware Least Recently Used (LA-LRU) replacement policy which ensures that cache blocks that are affected by process variation are accessed less frequently, and ii) Block Rearrangement scheme that distributes cache blocks with high latencies to all sets uniformly. We implemented our schemes on the Wattch Simple Scalar toolset for Xscale, PowerPC and Alpha21264-like processor configurations. Our experiments on SPEC 2000 benchmarks show that our scheme improves the average memory access time of caches by 11% to 22%, almost eliminating any performance degradation due to variations. We also synthesized the LA-LRU logic, to find out that we can obtain this benefit at negligible increase in the power consumption of the cache.","PeriodicalId":371062,"journal":{"name":"2011 24th Internatioal Conference on VLSI Design","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"LA-LRU: A Latency-Aware Replacement Policy for Variation Tolerant Caches\",\"authors\":\"Aarul Jain, Aviral Shrivastava, C. Chakrabarti\",\"doi\":\"10.1109/VLSID.2011.24\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Parameter variations in deep sub-micron integrated circuits cause chip characteristics to deviate during semiconductor fabrication process. These variations are dominant in memory systems such as caches and the delay spread due to process variation impacts the performance of a cache based system significantly. In this paper, we propose two schemes to reduce the performance impact of variations in caches: i) Latency-Aware Least Recently Used (LA-LRU) replacement policy which ensures that cache blocks that are affected by process variation are accessed less frequently, and ii) Block Rearrangement scheme that distributes cache blocks with high latencies to all sets uniformly. We implemented our schemes on the Wattch Simple Scalar toolset for Xscale, PowerPC and Alpha21264-like processor configurations. Our experiments on SPEC 2000 benchmarks show that our scheme improves the average memory access time of caches by 11% to 22%, almost eliminating any performance degradation due to variations. We also synthesized the LA-LRU logic, to find out that we can obtain this benefit at negligible increase in the power consumption of the cache.\",\"PeriodicalId\":371062,\"journal\":{\"name\":\"2011 24th Internatioal Conference on VLSI Design\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-01-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 24th Internatioal Conference on VLSI Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSID.2011.24\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 24th Internatioal Conference on VLSI Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSID.2011.24","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

深亚微米集成电路在半导体制造过程中参数的变化会导致芯片特性的偏离。这些变化在诸如缓存之类的内存系统中占主导地位,并且由于进程变化而导致的延迟扩展会显著影响基于缓存的系统的性能。在本文中,我们提出了两种方案来减少缓存变化对性能的影响:i)延迟感知的最近最少使用(LA-LRU)替换策略,该策略确保受进程变化影响的缓存块被较少访问;ii)块重排方案,该方案将具有高延迟的缓存块统一分配到所有集合。我们在watch Simple Scalar工具集上实现了我们的方案,该工具集适用于Xscale、PowerPC和类似alpha21264的处理器配置。我们在SPEC 2000基准测试上的实验表明,我们的方案将缓存的平均内存访问时间提高了11%到22%,几乎消除了由于变化而导致的任何性能下降。我们还合成了LA-LRU逻辑,以发现我们可以在缓存功耗增加可以忽略不计的情况下获得这种好处。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
LA-LRU: A Latency-Aware Replacement Policy for Variation Tolerant Caches
Parameter variations in deep sub-micron integrated circuits cause chip characteristics to deviate during semiconductor fabrication process. These variations are dominant in memory systems such as caches and the delay spread due to process variation impacts the performance of a cache based system significantly. In this paper, we propose two schemes to reduce the performance impact of variations in caches: i) Latency-Aware Least Recently Used (LA-LRU) replacement policy which ensures that cache blocks that are affected by process variation are accessed less frequently, and ii) Block Rearrangement scheme that distributes cache blocks with high latencies to all sets uniformly. We implemented our schemes on the Wattch Simple Scalar toolset for Xscale, PowerPC and Alpha21264-like processor configurations. Our experiments on SPEC 2000 benchmarks show that our scheme improves the average memory access time of caches by 11% to 22%, almost eliminating any performance degradation due to variations. We also synthesized the LA-LRU logic, to find out that we can obtain this benefit at negligible increase in the power consumption of the cache.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Intra-Flit Skew Reduction for Asynchronous Bypass Channel in NoCs Multiple Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization A GPU Algorithm for IC Floorplanning: Specification, Analysis and Optimization Low Offset, Low Noise, Variable Gain Interfacing Circuit with a Novel Scheme for Sensor Sensitivity and Offset Compensation for MEMS Based, Wheatstone Bridge Type, Resistive Smart Sensor Feedback Based Supply Voltage Control for Temperature Variation Tolerant PUFs
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1