{"title":"用软x射线光谱学表征分子电子学和数据存储材料","authors":"Xiaojiang Yu, H. Moser, Xingyu Gao, A. Wee","doi":"10.1142/S1793617908000033","DOIUrl":null,"url":null,"abstract":"SINS is a soft X-ray spectroscopy facility at SSLS, dedicated to Surface, Interface and Nanostructure Science of advanced materials. Developed over the past few years, the SINS end-station includes a photoemission spectroscopy analyzer, LEED, in situ STM/AFM, and a separate sample preparation chamber. Applications to such fields as molecular electronics, high density data storage, and nanonetwork templates are briefly reviewed.","PeriodicalId":166807,"journal":{"name":"Advances in Synchrotron Radiation","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"CHARACTERIZATION OF MATERIALS FOR MOLECULAR ELECTRONICS AND DATA STORAGE BY SOFT X-RAY SPECTROSCOPY\",\"authors\":\"Xiaojiang Yu, H. Moser, Xingyu Gao, A. Wee\",\"doi\":\"10.1142/S1793617908000033\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"SINS is a soft X-ray spectroscopy facility at SSLS, dedicated to Surface, Interface and Nanostructure Science of advanced materials. Developed over the past few years, the SINS end-station includes a photoemission spectroscopy analyzer, LEED, in situ STM/AFM, and a separate sample preparation chamber. Applications to such fields as molecular electronics, high density data storage, and nanonetwork templates are briefly reviewed.\",\"PeriodicalId\":166807,\"journal\":{\"name\":\"Advances in Synchrotron Radiation\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advances in Synchrotron Radiation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1142/S1793617908000033\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in Synchrotron Radiation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1142/S1793617908000033","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
CHARACTERIZATION OF MATERIALS FOR MOLECULAR ELECTRONICS AND DATA STORAGE BY SOFT X-RAY SPECTROSCOPY
SINS is a soft X-ray spectroscopy facility at SSLS, dedicated to Surface, Interface and Nanostructure Science of advanced materials. Developed over the past few years, the SINS end-station includes a photoemission spectroscopy analyzer, LEED, in situ STM/AFM, and a separate sample preparation chamber. Applications to such fields as molecular electronics, high density data storage, and nanonetwork templates are briefly reviewed.
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