{"title":"量子x射线成像的最新进展","authors":"S. Shwartz","doi":"10.1117/12.2662372","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":447677,"journal":{"name":"Quantum Sensing, Imaging, and Precision Metrology","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Recent advances in quantum x-ray imaging\",\"authors\":\"S. Shwartz\",\"doi\":\"10.1117/12.2662372\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":447677,\"journal\":{\"name\":\"Quantum Sensing, Imaging, and Precision Metrology\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Quantum Sensing, Imaging, and Precision Metrology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2662372\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Quantum Sensing, Imaging, and Precision Metrology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2662372","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0