基于深度学习的物联网故障诊断系统能否同时识别多个故障?

Alireza Salimy, I. Mitiche, P. Boreham, A. Nesbitt, G. Morison
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引用次数: 0

摘要

本研究的实验提出了一种故障诊断方法,并将其纳入物联网(IoT)系统,用于高压电站的状态监测。该方法基于信号处理方法的特征提取和深度学习模型来解决同时包含一个或多个故障的测量信号的故障分类问题。该系统通过对在线高压设备的一维电磁干扰(EMI)故障信号进行短时傅立叶变换(STFT)来实现特征提取。然后将生成的特征图与标签词嵌入并行使用,以训练和测试一个深度学习模型,该模型由图卷积网络(GCN)和卷积神经网络(CNN)组成,前者用于从标签共现矩阵和标签词嵌入中学习相互依赖的故障标签关系,后者用于从STFT数据表示中提取相关特征。所提出的系统解决了未充分解决的EMI多标签高压故障诊断问题,即使在严重不平衡的数据集上实施,也能在标签分类方面产生强大的结果,据作者所知,该系统提供了前所未有的性能水平,在故障诊断方面是工业上可接受的,并且可以在现实世界中成功实施基于物联网的状态监测系统。此外,理论上提出的系统具有可扩展性,可用于预测数据实例中存在的大量故障标签。
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Can a deep learning based IoT fault diagnosis system identify more than one fault at a time?
The experiments in this study propose a fault diagnosis method to incorporate in an internet-of-things (IoT) system for the condition monitoring of high-voltage generating stations. The approach is based on feature extraction with signal processing methods and a deep learning model to tackle fault classification in measured signals that contain one or more faults simultaneously. The proposed system implements feature extraction through the short-time Fourier transform (STFT) of 1-D electro-magnetic interference (EMI) fault signals obtained from online high-voltage (HV) assets. The produced feature maps are then used in parallel with label word embeddings to train and test a deep learning model consisting of, a graph convolutional network (GCN), implemented to learn inter-dependant fault label relationships from label co-occurrence matrices and label word embeddings, and a convolutional neural network (CNN) to extract relevant features from STFT data representations. The proposed system tackles the under-addressed EMI multi-label HV fault diagnosis problem and produces strong results in label classification even when implemented on a heavily imbalanced data set, to the author’s knowledge the system provides an unprecedented level of performance that is industrially acceptable in fault diagnosis and can be successfully implemented on a real-world IoT-based condition monitoring system. In addition, in theory the proposed system is scalable for the prediction of a higher quantity of fault labels present in data instances.
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