偏斜输出驱动开关对电磁发射的影响

B. Deutschmann, G. Winkler, R. Jungreithmair
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引用次数: 6

摘要

在今天的高速设计中,我们经常不得不处理GHz范围内的时钟速率和几皮秒量级的上升和下降时间。在这样的速度下,不能再假定设计不受寄生效应的影响。由于高速信号会产生高电磁辐射,因此产生了很多问题。这些高辐射可能导致电子系统的电磁兼容性严重退化。本文描述了斜置CMOS输出驱动器对电磁发射的抑制作用。详细解释了这种技术,并展示了如何使用倾斜来减少地面反弹以及集成电路的振铃。采用IEC 61967-2标准的TEM-cell法,测量了电磁兼容测试芯片的辐射电磁发射。结果表明,防止输出驱动器的开关同时减少了辐射电磁发射。由于大多数电子系统设计者对减少他们设计的电磁发射感兴趣,它也显示了如何使用这种技术来减少电子系统的发射。为此,设计了一种电磁兼容测试印刷电路板,并描述了偏斜对其电磁发射的影响。
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Effects of skewing output driver switching on the electromagnetic emission
In today's high speed designs we often have to deal with clock rates in the GHz range and rise and fall times in the order of a few pico seconds. At these speeds it can no longer be assumed that a design is immune to parasitic effects. A lot of problems originate from high speed signals as they cause high electromagnetic emissions. These high emissions may lead to serious degradations to the electromagnetic compatibility of an electronic system. In this paper, the reduction of the electromagnetic emissions by skewing CMOS output driver is described. This technique is explained in detail and it is shown how skewing can be used to reduce ground bounce as well as the ringing of an integrated circuit. Using the TEM-cell method (IEC 61967-2), the radiated electromagnetic emissions of an EMC test chip was measured. It is shown that preventing the output drivers from switching simultaneously reduces the radiated electromagnetic emission. As most of the electronic systems designers are interested in the reduction of the electromagnetic emission of their designs it is also shown how this technique can be used to reduce the emission of an electronic system. For this purpose an EMC test printed circuit board was designed and the effects of skewing on its electromagnetic emission are described.
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