原子力显微镜质谱分析中的微尺度输运物理和改进的采样效率

Hyunkyu Moon, T. Comi, Sage J. B. Dunham, B. Kwon, J. Sweedler, W. King
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引用次数: 0

摘要

本文报道了原子力显微镜(AFM)质谱分析(MS)的改进,其中通过加热的AFM悬臂尖端解吸1升分析物并用质谱仪进行分析。将原子力显微镜取样装置与质谱系统解耦,使微尺度输运物理分析不受分析物电离效率的影响。使用这种方法,我们发现传输效率是由采样时的空气速度决定的,而不是文献中报道的质量流率。我们还发现,与加热管相比,未加热的采样管具有更高的效率。运输参数的优化使系统效率提高了2.5倍。
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Microscale transport physics during atomic force microscopy mass spectrometry and improved sampling efficiency
This paper reports improvements of atomic force microscopy (AFM) mass spectrometry (MS), in which ∼1 attoliter of analyte is desorbed by a heated AFM cantilever tip and analyzed with a mass spectrometer. Decoupling the AFM sampling apparatus from the MS system enabled analysis of the microscale transport physics independent of analyte ionization efficiency. Using this approach, we find that the transport efficiency is governed by the air velocity during sampling, and not mass flow rate as reported in the literature. We also find that an unheated sampling tube results in higher efficiency compared to a heated tube. Optimization of the transport parameters improved the system efficiency by 2.5-fold over the state of the art.
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