{"title":"基于总线布局的印刷电路板总线驱动器短路早期诊断方法","authors":"K. Chakraborty, P. Mazumder","doi":"10.1109/ICCAD.1996.571363","DOIUrl":null,"url":null,"abstract":"This paper presents a new, layout-based approach to board-level shorts diagnosis for bussed drivers, with the goal of early repair of interconnect shorts so as to minimize (a) fault masking during opens testing and (b) driver abuse. This approach leads to an early diagnosis of more than 96% of shorts and simplifies the subsequent rest for opens considerably. Besides, this approach improves the production yield and field survivability of boards.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An efficient, bus-layout based method for early diagnosis of bussed driver shorts in printed circuit boards\",\"authors\":\"K. Chakraborty, P. Mazumder\",\"doi\":\"10.1109/ICCAD.1996.571363\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new, layout-based approach to board-level shorts diagnosis for bussed drivers, with the goal of early repair of interconnect shorts so as to minimize (a) fault masking during opens testing and (b) driver abuse. This approach leads to an early diagnosis of more than 96% of shorts and simplifies the subsequent rest for opens considerably. Besides, this approach improves the production yield and field survivability of boards.\",\"PeriodicalId\":408850,\"journal\":{\"name\":\"Proceedings of International Conference on Computer Aided Design\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-11-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of International Conference on Computer Aided Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCAD.1996.571363\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of International Conference on Computer Aided Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1996.571363","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An efficient, bus-layout based method for early diagnosis of bussed driver shorts in printed circuit boards
This paper presents a new, layout-based approach to board-level shorts diagnosis for bussed drivers, with the goal of early repair of interconnect shorts so as to minimize (a) fault masking during opens testing and (b) driver abuse. This approach leads to an early diagnosis of more than 96% of shorts and simplifies the subsequent rest for opens considerably. Besides, this approach improves the production yield and field survivability of boards.
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