概念模型中基于图的快速模式匹配框架

Nicolas Pflanzl, Dominic Breuker, Hanns-Alexander Dietrich, Matthias Steinhorst, Maria Shitkova, J. Becker, Patrick Delfmann
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引用次数: 0

摘要

我们为概念模型引入了一种模式匹配方法,适用于许多模型分析场景,如流程弱点检测、流程遵从性检查、语法验证和模型翻译。该方法不依赖于任何特定的建模语言,通过将概念模型视为标记图来实现。因此,我们使用算法图论中已知的模式匹配技术——子图同构和子图同胚。一般来说,解决这些问题的算法在计算上是昂贵的。然而,可以利用概念模型的特殊属性,如低树宽和平面性来保持计算复杂性。这使得模式匹配甚至适用于大型公司或集团中通常使用的大型模型。我们引入了一个高级元算法来检查输入模型和模式的结构属性,以决定哪种低级模式匹配算法可能最快地提供搜索结果。
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A Framework for Fast Graph-Based Pattern Matching in Conceptual Models
We introduce a pattern matching approach for conceptual models suitable for a number of model analysis scenarios like process weakness detection, process compliance checking, syntax verification and model translation. The approach does not depend on any particular modeling language which is achieved by treating conceptual models as labeled graphs. Consequently, we use pattern matching techniques known from algorithmic graph theory - sub graph isomorphism and sub graph homeomorphism. In general, algorithms solving these problems can be computationally expensive. However, special properties of conceptual models such as low tree width and planarity can be exploited to keep computational complexity manageable. This makes pattern matching applicable even to large models typically used in large companies or corporate groups. We introduce a high-level meta algorithm checking structural properties of input models and patterns to decide which low-level pattern matching algorithm will likely deliver search results quickest.
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