电极-电解质界面的空间电荷密度分布

Lalith Krishna Samanth Bonagiri, Kaustubh S. Panse, Shan Zhou, Haiyi Wu, Narayana R. Aluru, Yingjie Zhang
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摘要

电极-电解质界面的电荷分布在许多电化学过程中起着至关重要的作用,其中一些是电催化,超级电容器,电池等,然而,大多数实验技术,无论是显微镜还是光谱工具,用于探测这些系统,不能提供任何关于界面空间电荷分布的信息。基于开尔文探针力显微镜(KPFM)的技术可以提供一些信息,但是它们的分辨率深度非常有限,并且只能在极稀的电解质下工作。最近,我们开发了一种称为电荷剖面三维(3D)原子力显微镜(CP-3D-AFM)的技术,可以在埃深分辨率下绘制电荷密度图。该方法是基于测量不同电极电位下的3D-AFM图,并进一步使用静电计算来获得各自电位下的电荷密度深度分布。我们用这种方法测量了高离子电解质系统中的电荷分布,并可以解释它们的差分电容分布。这种CP-3D-AFM技术可以获得广泛的电解质系统的分子结构见解,并为工程有效的电极-电解质界面设计原则服务。
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Unraveling Spatial Charge Density Distributions at Electrode-Electrolyte Interfaces
Charge distributions at electrode-electrolyte interfaces play a crucial role in many electrochemical processes, some of which are electrocatalysis, supercapacitors, batteries etc., However, most experimental techniques, either microscopy or spectroscopy tools that are used to probe these systems, cannot provide any information about the interfacial spatial charge distribution. Techniques based on kelvin-probe force microscopy (KPFM) can provide some information, however they have a very limited depth of resolution and can only work with extremely dilute electrolytes. Recently, we developed a technique known as charge profiling three-dimensional (3D) atomic force microscopy (CP-3D-AFM) which could map out the charge densities at angstrom-depth resolution. The method is based on measuring 3D-AFM maps at different electrode potentials and further using electrostatic calculations to obtain the charge density depth profiles at the respective potentials. We used this method to measure charge distributions in highly ionic electrolyte systems and can explain their differential capacitance profiles. This CP-3D-AFM technique could enable to obtain molecular structural insights for a wide range of electrolyte systems and serve in designing principles for engineering effective electrode-electrolyte interfaces.
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