{"title":"儿童积极和消极计划量表的心理测量特征——美国不同青少年的简短形式","authors":"Wondimu Ahmed","doi":"10.1177/07342829231206576","DOIUrl":null,"url":null,"abstract":"This study examined the psychometric properties of the Positive and Negative Affect Schedule for Children-Short Form (PANAS-C-SF) in a diverse sample of 15-year-olds in the United States [N = 4382]. Multiple measurement models, including a one-factor model, two-factor orthogonal and oblique models, a three-factor model (PA, Fear, and Distress), and a bifactor model, were tested. The results supported a three-factor structure, with distinct factors for PA, Fear, and Distress. The PANAS-C-SF scores evidenced good internal consistency reliability. Measurement invariance analyses indicated that the three-factor structure was invariant across gender and racial-ethnic groups, suggesting the generalizability of the PANAS-C-SF across diverse populations. Furthermore, the three factors demonstrated criterion validity, with PA positively associated with life satisfaction and meaning in life, and Distress negatively associated with these outcomes. These findings support the psychometric properties of the PANAS-C-SF, highlighting its practical utility in assessing affect across diverse adolescent population.","PeriodicalId":51446,"journal":{"name":"Journal of Psychoeducational Assessment","volume":null,"pages":null},"PeriodicalIF":1.5000,"publicationDate":"2023-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Psychometric Properties of Positive and Negative Schedule Scale for Children-Short Form in Diverse American Adolescents\",\"authors\":\"Wondimu Ahmed\",\"doi\":\"10.1177/07342829231206576\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This study examined the psychometric properties of the Positive and Negative Affect Schedule for Children-Short Form (PANAS-C-SF) in a diverse sample of 15-year-olds in the United States [N = 4382]. Multiple measurement models, including a one-factor model, two-factor orthogonal and oblique models, a three-factor model (PA, Fear, and Distress), and a bifactor model, were tested. The results supported a three-factor structure, with distinct factors for PA, Fear, and Distress. The PANAS-C-SF scores evidenced good internal consistency reliability. Measurement invariance analyses indicated that the three-factor structure was invariant across gender and racial-ethnic groups, suggesting the generalizability of the PANAS-C-SF across diverse populations. Furthermore, the three factors demonstrated criterion validity, with PA positively associated with life satisfaction and meaning in life, and Distress negatively associated with these outcomes. These findings support the psychometric properties of the PANAS-C-SF, highlighting its practical utility in assessing affect across diverse adolescent population.\",\"PeriodicalId\":51446,\"journal\":{\"name\":\"Journal of Psychoeducational Assessment\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.5000,\"publicationDate\":\"2023-10-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Psychoeducational Assessment\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1177/07342829231206576\",\"RegionNum\":4,\"RegionCategory\":\"心理学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"PSYCHOLOGY, EDUCATIONAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Psychoeducational Assessment","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1177/07342829231206576","RegionNum":4,"RegionCategory":"心理学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PSYCHOLOGY, EDUCATIONAL","Score":null,"Total":0}
Psychometric Properties of Positive and Negative Schedule Scale for Children-Short Form in Diverse American Adolescents
This study examined the psychometric properties of the Positive and Negative Affect Schedule for Children-Short Form (PANAS-C-SF) in a diverse sample of 15-year-olds in the United States [N = 4382]. Multiple measurement models, including a one-factor model, two-factor orthogonal and oblique models, a three-factor model (PA, Fear, and Distress), and a bifactor model, were tested. The results supported a three-factor structure, with distinct factors for PA, Fear, and Distress. The PANAS-C-SF scores evidenced good internal consistency reliability. Measurement invariance analyses indicated that the three-factor structure was invariant across gender and racial-ethnic groups, suggesting the generalizability of the PANAS-C-SF across diverse populations. Furthermore, the three factors demonstrated criterion validity, with PA positively associated with life satisfaction and meaning in life, and Distress negatively associated with these outcomes. These findings support the psychometric properties of the PANAS-C-SF, highlighting its practical utility in assessing affect across diverse adolescent population.
期刊介绍:
The Journal of Psychoeducational Assessment (JPA) publishes contemporary and important information focusing on psychological and educational assessment research and evidence-based practices as well as assessment instrumentation. JPA is well known internationally for the quality of published assessment-related research, theory and practice papers, and book and test reviews. The methodologically sound and impiricially-based studies and critical test and book reviews will be of particular interest to all assessment specialists including practicing psychologists, psychoeducational consultants, educational diagnosticians and special educators.