{"title":"总统的消息","authors":"Juan Manuel Ramirez Cortés, Mark E. Davis","doi":"10.1109/mim.2023.10208250","DOIUrl":null,"url":null,"abstract":"On behalf of the Instrumentation and Measurement Society (IMS) I welcome you all to this special edition of the Instrumentation and Measurement Magazine, constituted by selected papers presented during AUTOTESTCON 2022. The Conference Committee has carried out a thorough review process to accept the papers presented at the conference. Subsequently, a few authors were invited to submit an extended version of their papers to conform this special issue with an orientation to wide audiences. As you can see, the Best Student Paper and Best Technical Paper are also proudly included in this edition. I would like to congratulate the authors, editors and reviewers for his valuable work in making this happen.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"President's Message\",\"authors\":\"Juan Manuel Ramirez Cortés, Mark E. Davis\",\"doi\":\"10.1109/mim.2023.10208250\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"On behalf of the Instrumentation and Measurement Society (IMS) I welcome you all to this special edition of the Instrumentation and Measurement Magazine, constituted by selected papers presented during AUTOTESTCON 2022. The Conference Committee has carried out a thorough review process to accept the papers presented at the conference. Subsequently, a few authors were invited to submit an extended version of their papers to conform this special issue with an orientation to wide audiences. As you can see, the Best Student Paper and Best Technical Paper are also proudly included in this edition. I would like to congratulate the authors, editors and reviewers for his valuable work in making this happen.\",\"PeriodicalId\":55025,\"journal\":{\"name\":\"IEEE Instrumentation & Measurement Magazine\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2023-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Instrumentation & Measurement Magazine\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/mim.2023.10208250\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Instrumentation & Measurement Magazine","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/mim.2023.10208250","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
On behalf of the Instrumentation and Measurement Society (IMS) I welcome you all to this special edition of the Instrumentation and Measurement Magazine, constituted by selected papers presented during AUTOTESTCON 2022. The Conference Committee has carried out a thorough review process to accept the papers presented at the conference. Subsequently, a few authors were invited to submit an extended version of their papers to conform this special issue with an orientation to wide audiences. As you can see, the Best Student Paper and Best Technical Paper are also proudly included in this edition. I would like to congratulate the authors, editors and reviewers for his valuable work in making this happen.
期刊介绍：
IEEE Instrumentation & Measurement Magazine is a bimonthly publication. It publishes in February, April, June, August, October, and December of each year. The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.
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