超越2018年杜氏肌营养不良症(DMD)骨质疏松症管理的最低国际护理考虑:第三届国际肌肉-骨骼相互作用会议的会议报告2022年11月7日和14日。

{"title":"超越2018年杜氏肌营养不良症(DMD)骨质疏松症管理的最低国际护理考虑:第三届国际肌肉-骨骼相互作用会议的会议报告2022年11月7日和14日。","authors":"Kim Phung, Nicola Crabtree, Anne M Connolly, Pat Furlong, Eric P Hoffman, Stefan A Jackowski, Soher Nagi Jayash, Alex Johnson, Khaldoun Koujok, Craig F Munns, Erik Niks, Frank Rauch, Rachel Schrader, Cathy Turner, Elizabeth Vroom, David R Weber, Brenda L Wong, Michela Guglieri, Leanne M Ward, Sze Choong Wong","doi":"10.3233/JND-230176","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10789336/pdf/","citationCount":"0","resultStr":"{\"title\":\"Moving Beyond the 2018 Minimum International Care Considerations for Osteoporosis Management in Duchenne Muscular Dystrophy (DMD): Meeting Report from the 3rd International Muscle-Bone Interactions Meeting 7th and 14th November 2022.\",\"authors\":\"Kim Phung, Nicola Crabtree, Anne M Connolly, Pat Furlong, Eric P Hoffman, Stefan A Jackowski, Soher Nagi Jayash, Alex Johnson, Khaldoun Koujok, Craig F Munns, Erik Niks, Frank Rauch, Rachel Schrader, Cathy Turner, Elizabeth Vroom, David R Weber, Brenda L Wong, Michela Guglieri, Leanne M Ward, Sze Choong Wong\",\"doi\":\"10.3233/JND-230176\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2024-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10789336/pdf/\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"3\",\"ListUrlMain\":\"https://doi.org/10.3233/JND-230176\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"3","ListUrlMain":"https://doi.org/10.3233/JND-230176","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}