Manjunatha, A. S. Bennal, N. M. Badiger, H. Stosnach, M. Y. Kariduraganavar
{"title":"样品载体对多痕量元素全反射x射线荧光分析参数的影响","authors":"Manjunatha, A. S. Bennal, N. M. Badiger, H. Stosnach, M. Y. Kariduraganavar","doi":"10.1080/00387010.2023.2285912","DOIUrl":null,"url":null,"abstract":"The Total reflection X-ray Fluorescence technique is increasingly popular for its simplicity and rapid elemental screening. This study evaluates the various analytical parameters including spectros...","PeriodicalId":21953,"journal":{"name":"Spectroscopy Letters","volume":"221 1","pages":""},"PeriodicalIF":1.1000,"publicationDate":"2023-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effect of sample carriers on analytical parameters in total reflection X-ray fluorescence - a tool for multi-trace elemental analysis\",\"authors\":\"Manjunatha, A. S. Bennal, N. M. Badiger, H. Stosnach, M. Y. Kariduraganavar\",\"doi\":\"10.1080/00387010.2023.2285912\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Total reflection X-ray Fluorescence technique is increasingly popular for its simplicity and rapid elemental screening. This study evaluates the various analytical parameters including spectros...\",\"PeriodicalId\":21953,\"journal\":{\"name\":\"Spectroscopy Letters\",\"volume\":\"221 1\",\"pages\":\"\"},\"PeriodicalIF\":1.1000,\"publicationDate\":\"2023-11-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Spectroscopy Letters\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://doi.org/10.1080/00387010.2023.2285912\",\"RegionNum\":4,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"SPECTROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Spectroscopy Letters","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.1080/00387010.2023.2285912","RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"SPECTROSCOPY","Score":null,"Total":0}
Effect of sample carriers on analytical parameters in total reflection X-ray fluorescence - a tool for multi-trace elemental analysis
The Total reflection X-ray Fluorescence technique is increasingly popular for its simplicity and rapid elemental screening. This study evaluates the various analytical parameters including spectros...
期刊介绍:
Spectroscopy Letters provides vital coverage of all types of spectroscopy across all the disciplines where they are used—including novel work in fundamental spectroscopy, applications, diagnostics and instrumentation. The audience is intended to be all practicing spectroscopists across all scientific (and some engineering) disciplines, including: physics, chemistry, biology, instrumentation science, and pharmaceutical science.