表面波对熔融硅中液气传质的影响

IF 0.5 Q4 PHYSICS, APPLIED Latvian Journal of Physics and Technical Sciences Pub Date : 2023-12-01 DOI:10.2478/lpts-2023-0049
G. Zageris, V. Geža, S. Pavlovs
{"title":"表面波对熔融硅中液气传质的影响","authors":"G. Zageris, V. Geža, S. Pavlovs","doi":"10.2478/lpts-2023-0049","DOIUrl":null,"url":null,"abstract":"Abstract The paper focuses on the numerical analysis of the mass transfer of impurities from the wavy surface of molten silicon to the gas phase. The mathematical model is described herein, with the modelling of a wavy silicon melt surface being done with the moving mesh technique. The model employs assumptions about the mass transfer process on the surface, namely, that it can be modelled with effective diffusion across the interface. The assumption is verified against limited experimental data for a stationary melt surface, and reasonable agreement is obtained. Thereafter, numerical studies are undertaken for a wavy melt surface. The dependence of impurity removal rate on the wave amplitude, wavelength and frequency is analysed. It is shown that the waves on the surface of the liquid increase the mass transfer rate in a certain parameter range. Finally, results are analysed to find an explanation for this increase and to determine technological factors that impact it. Surface enlargement due to waves and altered flow patterns near the silicon melt are determined as potential reasons for the improved impurity removal rate. A dimensionless criterion for the minimal wave amplitude required to obtain improved impurity removal is found and discussed.","PeriodicalId":43603,"journal":{"name":"Latvian Journal of Physics and Technical Sciences","volume":" 11","pages":"106 - 123"},"PeriodicalIF":0.5000,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Influence of Surface Waves on Liquid-to-Gas Mass Transfer in Molten Silicon\",\"authors\":\"G. Zageris, V. Geža, S. Pavlovs\",\"doi\":\"10.2478/lpts-2023-0049\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract The paper focuses on the numerical analysis of the mass transfer of impurities from the wavy surface of molten silicon to the gas phase. The mathematical model is described herein, with the modelling of a wavy silicon melt surface being done with the moving mesh technique. The model employs assumptions about the mass transfer process on the surface, namely, that it can be modelled with effective diffusion across the interface. The assumption is verified against limited experimental data for a stationary melt surface, and reasonable agreement is obtained. Thereafter, numerical studies are undertaken for a wavy melt surface. The dependence of impurity removal rate on the wave amplitude, wavelength and frequency is analysed. It is shown that the waves on the surface of the liquid increase the mass transfer rate in a certain parameter range. Finally, results are analysed to find an explanation for this increase and to determine technological factors that impact it. Surface enlargement due to waves and altered flow patterns near the silicon melt are determined as potential reasons for the improved impurity removal rate. A dimensionless criterion for the minimal wave amplitude required to obtain improved impurity removal is found and discussed.\",\"PeriodicalId\":43603,\"journal\":{\"name\":\"Latvian Journal of Physics and Technical Sciences\",\"volume\":\" 11\",\"pages\":\"106 - 123\"},\"PeriodicalIF\":0.5000,\"publicationDate\":\"2023-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Latvian Journal of Physics and Technical Sciences\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2478/lpts-2023-0049\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"PHYSICS, APPLIED\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Latvian Journal of Physics and Technical Sciences","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2478/lpts-2023-0049","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0

摘要

摘要:本文着重对硅液波纹表面杂质向气相的传质过程进行了数值分析。本文描述了用移动网格技术对波浪状硅熔体表面进行建模的数学模型。该模型采用了关于表面传质过程的假设,即,它可以通过界面上的有效扩散来建模。用有限的固定熔体表面实验数据验证了这一假设,得到了合理的一致性。然后,对波浪状熔体表面进行了数值研究。分析了杂质去除率与波幅、波长和频率的关系。结果表明,在一定的参数范围内,液体表面的波增加了传质速率。最后,对结果进行分析,以找到这种增长的解释,并确定影响它的技术因素。由于硅熔体附近的波和流动模式的改变而引起的表面扩大被确定为杂质去除率提高的潜在原因。找到并讨论了获得改进的杂质去除所需的最小波幅的无量纲准则。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Influence of Surface Waves on Liquid-to-Gas Mass Transfer in Molten Silicon
Abstract The paper focuses on the numerical analysis of the mass transfer of impurities from the wavy surface of molten silicon to the gas phase. The mathematical model is described herein, with the modelling of a wavy silicon melt surface being done with the moving mesh technique. The model employs assumptions about the mass transfer process on the surface, namely, that it can be modelled with effective diffusion across the interface. The assumption is verified against limited experimental data for a stationary melt surface, and reasonable agreement is obtained. Thereafter, numerical studies are undertaken for a wavy melt surface. The dependence of impurity removal rate on the wave amplitude, wavelength and frequency is analysed. It is shown that the waves on the surface of the liquid increase the mass transfer rate in a certain parameter range. Finally, results are analysed to find an explanation for this increase and to determine technological factors that impact it. Surface enlargement due to waves and altered flow patterns near the silicon melt are determined as potential reasons for the improved impurity removal rate. A dimensionless criterion for the minimal wave amplitude required to obtain improved impurity removal is found and discussed.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
CiteScore
1.50
自引率
16.70%
发文量
41
审稿时长
5 weeks
期刊介绍: Latvian Journal of Physics and Technical Sciences (Latvijas Fizikas un Tehnisko Zinātņu Žurnāls) publishes experimental and theoretical papers containing results not published previously and review articles. Its scope includes Energy and Power, Energy Engineering, Energy Policy and Economics, Physical Sciences, Physics and Applied Physics in Engineering, Astronomy and Spectroscopy.
期刊最新文献
The Use of Renewable Energy and Capillary Heat Exchangers for Energy Savings in the Existing Apartment Modelling of Methanol Production From Biogas Applying Dynamic U-Value Measurements for State Forecasting in Buildings Numerical Insights Into Gas Mixing System Design for Energy Conversion Processes Density-Based Topological Optimization of 3D-Printed Casts for Fracture Treatment with Freefem Software
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1