{"title":"撤回:移动目标信息感知技术在智能监管系统中的应用。","authors":"Scanning","doi":"10.1155/2023/9847959","DOIUrl":null,"url":null,"abstract":"<p><p>[This retracts the article DOI: 10.1155/2022/5192601.].</p>","PeriodicalId":21633,"journal":{"name":"Scanning","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-12-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10733009/pdf/","citationCount":"0","resultStr":"{\"title\":\"Retracted: Application of Moving Target Information Perception Technology in Intelligent Supervision System.\",\"authors\":\"Scanning\",\"doi\":\"10.1155/2023/9847959\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>[This retracts the article DOI: 10.1155/2022/5192601.].</p>\",\"PeriodicalId\":21633,\"journal\":{\"name\":\"Scanning\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-12-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10733009/pdf/\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Scanning\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1155/2023/9847959\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"2023/1/1 0:00:00\",\"PubModel\":\"eCollection\",\"JCR\":\"Q3\",\"JCRName\":\"Physics and Astronomy\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Scanning","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1155/2023/9847959","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2023/1/1 0:00:00","PubModel":"eCollection","JCR":"Q3","JCRName":"Physics and Astronomy","Score":null,"Total":0}
期刊介绍:
Scanning provides an international and interdisciplinary medium for the rapid exchange of information among all scientists interested in scanning electron, scanning probe, and scanning optical microscopies. Areas of specific interest include all aspects of the instrumentation associated with scanning microscopies, correlative microscopy techniques, stereometry, stereology, analytic techniques, and novel applications of the microscopies.