超越 MicroED:利用 4D-STEM 的 ab initio 晶体结构

Ambarneil Saha, Alexander J. Pattison, Matthew Mecklenburg, Aaron Brewster, P. Ercius, Jose A. Rodriguez
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摘要

微晶电子衍射(microED)最近已逐渐成为结构化学领域的一项主流技术。由于微电子衍射技术能够检测对传统X射线衍射技术而言小得多的纳米晶体,因此能够对一些以前被认为无法用X射线晶体学方法解决的物质进行固态结构阐释。然而,由于存在无序、重叠或其他衍射效果不佳的结构域,所有这些因素通常都会降低数据质量,因此选定区域孔径显微电子显微技术仍然受到阻碍。正如晶体尺寸的不足在历史上阻碍了传统的 X 射线方法一样,这些纳米尺度的缺陷也经常阻碍使用经典的显微ED 解决结构问题。为了克服这一问题,我们将四维扫描透射电子显微镜(4D - STEM)与电子衍射层析成像技术相结合,对跨越广泛化学空间的晶体结构进行了研究,包括对光束敏感的有机金属复合物和生物分子有机化合物。4D - STEM 利用扫描纳米光束在用户选定的晶体试样区域内进行二维光栅扫描,记录真实空间点阵列的电离模式。例如,在 500 nm 2 的照明区域内,可以每隔 5 nm 采集一个单独的衍射图样。因此,从概念上讲,4D - STEM 提供了一种固有的串行双折射方法,只需在单晶体上以纳米级精度定位即可。我们的研究成果代表了首例通过直接方法进行初始相位分析的 4D - STEM 结构。与标准 microED 不同,4D - STEM 的数据采集不受 SA 孔径形状或大小的限制。相反,4D- STEM 能够事后构建定制的虚拟孔径,从而在实际空间中精确定位哪些晶体区域在倒易空间中促成了布拉格衍射。我们将这些区域称为相干衍射区(CDZ)。这使我们能够摒弃来自相干性差的衍射域、旋转方向错误的衍射域和相干性差的衍射域的无用信号。
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Beyond MicroED: ab initio crystal structures using 4D-STEM
Microcrystal electron diffraction (microED) has recently morphed into an increasingly mainstream technique in structural chemistry. Its ability to interrogate nanocrystals orders of magnitude too small for conventional X - ray diffraction has enabled solid -state structure elucidation of several species previously considered impossible to solve using X -ray crystallogr aphy. Nevertheless, selected area aperture-enabled microED remains thwarted by the presence of disordered, overlapping, or otherwise poorly diffracting domains, all of which routinely conspire to diminish data quality. Just as insufficient crystal size histor ically stymied conventional X - ray methods, these nanoscale defects frequently prohibit structure solution using classical microED. To overcome this, we apply 4D scanning transmission electron microscopy (4D - STEM) in conjunction with electron diffraction tomography to interrogate crystal structures spanning a wide gamut of chemical space, including beam-sensitive organometallic complexes and biomolecular organic compounds. 4D - STEM leverages a scanning nanobeam to record ED patterns at an array of real-space points defined by a 2D raster scan across a user -selected region of a crystalline specimen. For instance, within an illuminated area of 500 nm 2, individual diffraction patterns can be collected every 5 nm. Conceptually, therefore, 4D – STEM provides an inherently serial approach to diffraction, simply localized with nanoscale precision onto the canvas of a single crystal. Our results represent the fi rst 4D - STEM structures phased ab initio by direct methods. Unlike standard microED, data acquisition in 4D - STEM is not constrained by the shape or size of the SA aperture. Instead, 4D - STEM enables the ex post facto construction of bespoke virtual apertures, allowing for precise real - space localization of exactly which domains of crystal contributed to pro ductive Bragg diffraction in reciprocal space. We refer to these regions as coherently diffracting zones (CDZs). This empowers us to discard unwanted signal from poorly diffracting domains, rotationally misoriented
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