Maria Fernanda Villa-Bracamonte , Jose Raul Montes-Bojorquez , Arturo A. Ayon
{"title":"通过分光椭偏仪和分光光度计研究过氧化物太阳能电池薄膜堆的光学特性","authors":"Maria Fernanda Villa-Bracamonte , Jose Raul Montes-Bojorquez , Arturo A. Ayon","doi":"10.1016/j.rio.2024.100640","DOIUrl":null,"url":null,"abstract":"<div><p>Spectroscopic ellipsometry is a reproducible and non-invasive characterization technique that allows the evaluation of multilayered structures. However, it is an indirect technique and requires the use of well-calibrated models to correctly analyze the materials. In this work, we report a multilayer modeling approach to investigate the optical properties of the three layers of interest typically employed on an inverted perovskite solar cells structure, namely, indium-tin-oxide (ITO) as a transparent anode, poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) as a hole transport layer, and methylammonium lead iodide (MAPbI<sub>3</sub>) as the perovskite layer. The parameterized optical constants based on oscillator models were simultaneously fitted to ellipsometry and intensity-transmission data and validated with ultraviolet–visible (UV–Vis) spectroscopy and profilometry. We propose this multilayer modeling approach as a method to be employed throughout the different stages of the fabrication process to study the distinct mechanisms that impact the final performance of a photovoltaic device.</p></div>","PeriodicalId":21151,"journal":{"name":"Results in Optics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S2666950124000373/pdfft?md5=1cd4c87d7207ed23553612c8dc602fa1&pid=1-s2.0-S2666950124000373-main.pdf","citationCount":"0","resultStr":"{\"title\":\"Optical properties study of a perovskite solar cell film stack by spectroscopic ellipsometry and spectrophotometry\",\"authors\":\"Maria Fernanda Villa-Bracamonte , Jose Raul Montes-Bojorquez , Arturo A. Ayon\",\"doi\":\"10.1016/j.rio.2024.100640\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Spectroscopic ellipsometry is a reproducible and non-invasive characterization technique that allows the evaluation of multilayered structures. However, it is an indirect technique and requires the use of well-calibrated models to correctly analyze the materials. In this work, we report a multilayer modeling approach to investigate the optical properties of the three layers of interest typically employed on an inverted perovskite solar cells structure, namely, indium-tin-oxide (ITO) as a transparent anode, poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) as a hole transport layer, and methylammonium lead iodide (MAPbI<sub>3</sub>) as the perovskite layer. The parameterized optical constants based on oscillator models were simultaneously fitted to ellipsometry and intensity-transmission data and validated with ultraviolet–visible (UV–Vis) spectroscopy and profilometry. We propose this multilayer modeling approach as a method to be employed throughout the different stages of the fabrication process to study the distinct mechanisms that impact the final performance of a photovoltaic device.</p></div>\",\"PeriodicalId\":21151,\"journal\":{\"name\":\"Results in Optics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-02-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.sciencedirect.com/science/article/pii/S2666950124000373/pdfft?md5=1cd4c87d7207ed23553612c8dc602fa1&pid=1-s2.0-S2666950124000373-main.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Results in Optics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S2666950124000373\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Physics and Astronomy\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Results in Optics","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2666950124000373","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Physics and Astronomy","Score":null,"Total":0}
Optical properties study of a perovskite solar cell film stack by spectroscopic ellipsometry and spectrophotometry
Spectroscopic ellipsometry is a reproducible and non-invasive characterization technique that allows the evaluation of multilayered structures. However, it is an indirect technique and requires the use of well-calibrated models to correctly analyze the materials. In this work, we report a multilayer modeling approach to investigate the optical properties of the three layers of interest typically employed on an inverted perovskite solar cells structure, namely, indium-tin-oxide (ITO) as a transparent anode, poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) as a hole transport layer, and methylammonium lead iodide (MAPbI3) as the perovskite layer. The parameterized optical constants based on oscillator models were simultaneously fitted to ellipsometry and intensity-transmission data and validated with ultraviolet–visible (UV–Vis) spectroscopy and profilometry. We propose this multilayer modeling approach as a method to be employed throughout the different stages of the fabrication process to study the distinct mechanisms that impact the final performance of a photovoltaic device.