Xuewen Gao, Ying Wang, Qing Su, Yan Su, Mengmeng Zhao, Yilin Wang, Guili Liu, Guoying Zhang
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引用次数: 0
摘要
通过第一性原理计算,系统地研究了双轴应变对掺杂 O 的单层 MoS2 的影响。结果表明,应变会降低掺杂 O 的单层 MoS2 的结构稳定性。在 0% 到 12% 的拉伸应变之间,带隙逐渐变窄。在不同的压缩应变下,带隙先增大后减小。光学特性分析表明,应变会导致介电函数的实部和虚部的峰值出现在低能区。应变还影响了掺杂系统的吸收峰和反射峰,使其在紫外区对光子有很强的吸收。掺杂体系在 0-10[式中:见正文]eV 范围内出现共振。该研究结果验证了应变可以适当调节 O 掺杂单层 MoS2 的电子和光学特性,为 MoS2 在光电器件中的应用提供了理论参考。
Electronic and optical properties of strain-regulated O-doped monolayer MoS2
The effect of biaxial strain on O-doped monolayers MoS2 has been systematically studied by the first-principles calculations. It is shown that the strain decreases the structural stability of O-doped monolayer MoS2. Between 0% and 12% tensile strains, the bandgap steadily narrows. At different compression strains, the bandgap increases and then decreases. The optical properties analysis shows that the strain causes the peaks of both the real and imaginary parts of the dielectric function to appear in the low energy region. And it affects the absorption and reflection peaks of the doping system so that it has a strong absorption of photons in the ultraviolet region. The doping system shows resonance in the range of 0–10[Formula: see text]eV. The results of this study verify that strain can properly regulate the electronic and optical properties of O-doped monolayer MoS2, and provide a theoretical reference for the implementation of MoS2 in optoelectronic devices.