Tamme Claus, Gaurav Achuda, Jonas Bünger, Silvia Richter, Manuel Torrilhon
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引用次数: 0
摘要
电子探针显微分析 (EPMA) 是一种无损技术，用于确定微米到纳米范围内材料样品的化学成分。基于 X 射线的强度测量，EPMA 可测定样品的化学成分。
An Adjoint Method for High-Resolution EPMA Based on the Spherical Harmonics (PN) Model of Electron Transport
Electron Probe Microanalysis (EPMA) is a nondestructive technique to determine the chemical composition of material samples in the micro- to nanometer range. Based on intensity measurements of x-ra...
期刊介绍：
Emphasizing computational methods and theoretical studies, this unique journal invites articles on neutral-particle transport, kinetic theory, radiative transfer, charged-particle transport, and macroscopic transport phenomena. In addition, the journal encourages articles on uncertainty quantification related to these fields. Offering a range of information and research methodologies unavailable elsewhere, Journal of Computational and Theoretical Transport brings together closely related mathematical concepts and techniques to encourage a productive, interdisciplinary exchange of ideas.
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