硫酸三甘氨酸 (001)、(010)、(101)、(1̄1̄1) 和 (1̄11) 面的载荷-压痕尺寸相关性理论模型研究

D. Nagaraju, P. Raja Shekar, D. Madhavi Latha
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引用次数: 0

摘要

硫酸甘氨酸铁电体(TGS)单晶是通过 30-40 天的缓慢蒸发技术生长出来的。对 TGS 晶体的(001)、(010)、(101)、([式:见正文][式:见正文]1)和([式:见正文]11)面进行了维氏硬度研究。我们利用铁电相的(001)面和(010)面来研究硬度的温度依赖性。使用五种理论模型,即 Meyer 定律、Hays-Kendall、弹性/塑性变形 (EPD)、试样电阻比例 (PSR) 和修正 PSR 模型,对所有研究晶面的压痕尺寸效应 (ISE) 进行了研究。实验结果表明,改进的 PSR 模型在生成与载荷无关的硬度数据以及解释 ISE 的起源方面更为精确。
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Investigations on theoretical models describing the load-indentation size dependence for (001), (010), (101), (1̄1̄1) and (1̄11) faces of triglycine sulphate
Ferroelectric triglycine sulphate (TGS) single crystals were grown by slow evaporation technique over a period of 30–40 days. The Vickers microhardness studies have been carried out on (001), (010), (101), ([Formula: see text][Formula: see text]1) and ([Formula: see text]11) faces of the TGS crystal. The as-grown (001) face and (010) face with the ferroelectric phase were used to study the temperature dependence of hardness. The indentation size effect (ISE) described using the five theoretical models viz., Meyer’s law, Hays–Kendall, elastic/plastic deformation (EPD), proportional specimen resistance (PSR) and modified PSR model has been investigated on all the crystal faces under study. The experimental results show that the modified PSR model is more accurate at generating load-independent hardness data and also for explaining the origin of ISE.
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