采用凹栅极和超薄再生氮化铝势垒的常关断氮化镓基 MIS-HEMT 性能提升

{"title":"采用凹栅极和超薄再生氮化铝势垒的常关断氮化镓基 MIS-HEMT 性能提升","authors":"Shogo Maeda, K. Shinohara, M. Empizo, Nobuhiko Sarukura, M. Kuzuhara, Akio Yamamoto, J. Asubar, S. Kawabata, I. Nagase, A. Baratov, Masaki Ishiguro, Toi Nezu, T. Igarashi, Kishi Sekiyama, S. Terai","doi":"10.5573/jsts.2024.24.1.25","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":0,"journal":{"name":"","volume":"29 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improved Performance of Normally-off GaN-based MIS-HEMTs with Recessed-gate and Ultrathin Regrown AlGaN Barrier\",\"authors\":\"Shogo Maeda, K. Shinohara, M. Empizo, Nobuhiko Sarukura, M. Kuzuhara, Akio Yamamoto, J. Asubar, S. Kawabata, I. Nagase, A. Baratov, Masaki Ishiguro, Toi Nezu, T. Igarashi, Kishi Sekiyama, S. Terai\",\"doi\":\"10.5573/jsts.2024.24.1.25\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":0,\"journal\":{\"name\":\"\",\"volume\":\"29 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0,\"publicationDate\":\"2024-02-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.5573/jsts.2024.24.1.25\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.5573/jsts.2024.24.1.25","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}