Qingmin Si, Yonghang Zhao, Junyan Li, Hang Wang, Kai Zhai
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Risk Cause Analysis of Runway Excursion Accidents in the Aircraft Landing Stage through Integrated FTA-BN Method
Runway excursion accidents in the aircraft landing stage are the emphasis in civil aviation safety management. Correctly analyzing and evaluating the influencing factors of runway excursion accidents are the key issues in the current research. In this study, a fault tree model was established to the runway excursion accident risk in the aircraft landing stage based on the fault tree analysis method. Then, the basic events leading to aircraft runway excursions were summarized
期刊介绍:
The Journal of Engineering Science and Technology Review (JESTR) is a peer reviewed international journal publishing high quality articles dediicated to all aspects of engineering. The Journal considers only manuscripts that have not been published (or submitted simultaneously), at any language, elsewhere. Contributions are in English. The Journal is published by the Eastern Macedonia and Thrace Institute of Technology (EMaTTech), located in Kavala, Greece. All articles published in JESTR are licensed under a CC BY-NC license. Copyright is by the publisher and the authors.