电子束对氨盐和铵盐晶体及薄膜的作用

IF 0.6 4区 化学 Q4 CHEMISTRY, APPLIED Russian Journal of Applied Chemistry Pub Date : 2024-04-10 DOI:10.1134/s1070427223070078
E. N. Razov, V. V. Semenov
{"title":"电子束对氨盐和铵盐晶体及薄膜的作用","authors":"E. N. Razov, V. V. Semenov","doi":"10.1134/s1070427223070078","DOIUrl":null,"url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>The action of an electron beam on crystals of tetramethylethylenediaminium nitrilotriacetate [HMe<sub>2</sub>NCH<sub>2</sub>CH<sub>2</sub>NMe<sub>2</sub>H]<sup>2+</sup>[HN(CH<sub>2</sub>COOH)(CH<sub>2</sub>COO)<sub>2</sub>]<sup>–</sup><sub>2</sub>, ammonium heptamolybdate tetrahydrate (NH<sub>4</sub>)<sub>6</sub>Mo<sub>7</sub>O<sub>24</sub>‧4H<sub>2</sub>O, and polymeric zinc nitrilotrimethylenephosphonate trihydrate (ZnH<sub>4</sub>L‧3H<sub>2</sub>O)<sub><i>n</i></sub>, on a lamellar crystal of 2,2'-(ethylenedioxy)di(ethylaminium) trifluoroacetate CF<sub>3</sub>C(O)O<sup>‒</sup> <sup>+</sup>H<sub>3</sub>N(CH<sub>2</sub>CH<sub>2</sub>O)<sub>2</sub>CH<sub>2</sub>CH<sub>2</sub>NH<sub>3</sub><sup>+‒</sup>O(O)CCF<sub>3</sub>, and on films of the monoethanolaminium salt of ethylenediaminetetraacetic acid [Н<sub>3</sub>NCH<sub>2</sub>CH<sub>2</sub>OH]<sup>+</sup><sub>2</sub>[(OOCCH<sub>2</sub>)<sub>2</sub>NCH<sub>2</sub>CH<sub>2</sub>N(CH<sub>2</sub>COOH)<sub>2</sub>]<sup>2–</sup> was studied. A Tescan VEGA II electron microscope was used as an exposure tool. The microrelief was examined at magnifications from 500× to 50000×. The survey was carried out at an accelerating voltage of 20 kV and a working distance of 2–8 mm, using secondary (SE) and backscattered (BSE) electron detectors. A copper–nickel alloy and silicate glass were used as the substrate material for the films. The crystals and films were irradiated with an electron beam of various powers, forming an area 20 × 20 μm in size. At low power, the area dimensions are strictly 20 × 20 μm, and the surface remains relatively flat. An increase in the power or in the exposure time while maintaining the power causes an increase in the size by 5 to 34%. The maximum impact causes the formation of defects in the form of cracks, swellings, bubbles, holes, and craters. The elevation of the surface increases with increasing radiation dose.</p>","PeriodicalId":757,"journal":{"name":"Russian Journal of Applied Chemistry","volume":null,"pages":null},"PeriodicalIF":0.6000,"publicationDate":"2024-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Action of an Electron Beam on Crystals and Films of Aminium and Ammonium Salts\",\"authors\":\"E. N. Razov, V. V. Semenov\",\"doi\":\"10.1134/s1070427223070078\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<h3 data-test=\\\"abstract-sub-heading\\\">Abstract</h3><p>The action of an electron beam on crystals of tetramethylethylenediaminium nitrilotriacetate [HMe<sub>2</sub>NCH<sub>2</sub>CH<sub>2</sub>NMe<sub>2</sub>H]<sup>2+</sup>[HN(CH<sub>2</sub>COOH)(CH<sub>2</sub>COO)<sub>2</sub>]<sup>–</sup><sub>2</sub>, ammonium heptamolybdate tetrahydrate (NH<sub>4</sub>)<sub>6</sub>Mo<sub>7</sub>O<sub>24</sub>‧4H<sub>2</sub>O, and polymeric zinc nitrilotrimethylenephosphonate trihydrate (ZnH<sub>4</sub>L‧3H<sub>2</sub>O)<sub><i>n</i></sub>, on a lamellar crystal of 2,2'-(ethylenedioxy)di(ethylaminium) trifluoroacetate CF<sub>3</sub>C(O)O<sup>‒</sup> <sup>+</sup>H<sub>3</sub>N(CH<sub>2</sub>CH<sub>2</sub>O)<sub>2</sub>CH<sub>2</sub>CH<sub>2</sub>NH<sub>3</sub><sup>+‒</sup>O(O)CCF<sub>3</sub>, and on films of the monoethanolaminium salt of ethylenediaminetetraacetic acid [Н<sub>3</sub>NCH<sub>2</sub>CH<sub>2</sub>OH]<sup>+</sup><sub>2</sub>[(OOCCH<sub>2</sub>)<sub>2</sub>NCH<sub>2</sub>CH<sub>2</sub>N(CH<sub>2</sub>COOH)<sub>2</sub>]<sup>2–</sup> was studied. A Tescan VEGA II electron microscope was used as an exposure tool. The microrelief was examined at magnifications from 500× to 50000×. The survey was carried out at an accelerating voltage of 20 kV and a working distance of 2–8 mm, using secondary (SE) and backscattered (BSE) electron detectors. A copper–nickel alloy and silicate glass were used as the substrate material for the films. The crystals and films were irradiated with an electron beam of various powers, forming an area 20 × 20 μm in size. At low power, the area dimensions are strictly 20 × 20 μm, and the surface remains relatively flat. An increase in the power or in the exposure time while maintaining the power causes an increase in the size by 5 to 34%. The maximum impact causes the formation of defects in the form of cracks, swellings, bubbles, holes, and craters. The elevation of the surface increases with increasing radiation dose.</p>\",\"PeriodicalId\":757,\"journal\":{\"name\":\"Russian Journal of Applied Chemistry\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.6000,\"publicationDate\":\"2024-04-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Russian Journal of Applied Chemistry\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://doi.org/10.1134/s1070427223070078\",\"RegionNum\":4,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"CHEMISTRY, APPLIED\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Russian Journal of Applied Chemistry","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.1134/s1070427223070078","RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"CHEMISTRY, APPLIED","Score":null,"Total":0}
引用次数: 0

摘要

摘要 电子束作用于四甲基乙二胺硝基三乙酸盐[HMe2NCH2CH2NMe2H]2+[HN(CH2COOH)(CH2COO)2]-2、四水七钼酸铵 (NH4)6Mo7O24‧4H2O 和三水聚合次氮基三亚甲基膦酸锌 (ZnH4L‧3H2O)n、2,2'-(亚乙二氧基)二(乙铵)三氟乙酸盐 CF3C(O)O- +H3N(CH2CH2O)2CH2CH2NH3+-O(O)CCF3 的片状晶体上、和乙二胺四乙酸单乙醇铵盐 [Н3NCH2CH2OH]+2[(OOCCH2)2NCH2CH2N(CH2COOH)2]2-]的薄膜进行了研究。使用 Tescan VEGA II 电子显微镜作为曝光工具。在 500× 至 50000× 的放大倍率下对微观浮雕进行了观察。在 20 kV 的加速电压和 2-8 mm 的工作距离下,使用二次电子(SE)和背散射(BSE)电子探测器进行了检测。薄膜的基底材料是铜镍合金和硅酸盐玻璃。用不同功率的电子束照射晶体和薄膜,形成 20 × 20 μm 大小的区域。在低功率下,区域尺寸严格为 20 × 20 μm,表面保持相对平整。在保持功率不变的情况下,功率或曝光时间的增加会导致尺寸增大 5% 至 34%。最大冲击力会导致裂纹、膨胀、气泡、孔洞和凹坑等缺陷的形成。表面隆起随着辐射剂量的增加而增加。
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Action of an Electron Beam on Crystals and Films of Aminium and Ammonium Salts

Abstract

The action of an electron beam on crystals of tetramethylethylenediaminium nitrilotriacetate [HMe2NCH2CH2NMe2H]2+[HN(CH2COOH)(CH2COO)2]2, ammonium heptamolybdate tetrahydrate (NH4)6Mo7O24‧4H2O, and polymeric zinc nitrilotrimethylenephosphonate trihydrate (ZnH4L‧3H2O)n, on a lamellar crystal of 2,2'-(ethylenedioxy)di(ethylaminium) trifluoroacetate CF3C(O)O +H3N(CH2CH2O)2CH2CH2NH3+‒O(O)CCF3, and on films of the monoethanolaminium salt of ethylenediaminetetraacetic acid [Н3NCH2CH2OH]+2[(OOCCH2)2NCH2CH2N(CH2COOH)2]2– was studied. A Tescan VEGA II electron microscope was used as an exposure tool. The microrelief was examined at magnifications from 500× to 50000×. The survey was carried out at an accelerating voltage of 20 kV and a working distance of 2–8 mm, using secondary (SE) and backscattered (BSE) electron detectors. A copper–nickel alloy and silicate glass were used as the substrate material for the films. The crystals and films were irradiated with an electron beam of various powers, forming an area 20 × 20 μm in size. At low power, the area dimensions are strictly 20 × 20 μm, and the surface remains relatively flat. An increase in the power or in the exposure time while maintaining the power causes an increase in the size by 5 to 34%. The maximum impact causes the formation of defects in the form of cracks, swellings, bubbles, holes, and craters. The elevation of the surface increases with increasing radiation dose.

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来源期刊
CiteScore
1.60
自引率
11.10%
发文量
63
审稿时长
2-4 weeks
期刊介绍: Russian Journal of Applied Chemistry (Zhurnal prikladnoi khimii) was founded in 1928. It covers all application problems of modern chemistry, including the structure of inorganic and organic compounds, kinetics and mechanisms of chemical reactions, problems of chemical processes and apparatus, borderline problems of chemistry, and applied research.
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