用扫描电子显微镜和 X 射线电子探针显微分析方法研究蒙古的稀有金属花岗岩、伟晶岩和变质岩矿物

IF 1.5 4区 物理与天体物理 Q3 SPECTROSCOPY X-Ray Spectrometry Pub Date : 2024-04-17 DOI:10.1002/xrs.3428
Olga Yu. Belozerova, Victor S. Antipin, Larisa V. Kushch, D. Odgerel
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引用次数: 0

摘要

利用扫描电子显微镜(SEM)和 X 射线电子探针显微分析(EPMA)方法,开发了针对花岗岩、伟晶岩和变质岩的成岩矿物和次要矿物的多组分 X 射线电子探针显微分析技术。在选择元素分析线的激发和记录条件时,考虑了所研究材料的特性。由于测定的元素分析线相互重叠而造成的分析信号失真,使用重叠系数进行了校正,重叠系数是之前在不含测定元素的样品上测定的。对 EPMA 技术计量特性的评估表明,该技术符合《国际地质分析实验室专业测试计划》(GeoPT)采用的第二类定量测定质量要求和第二类分析要求。所开发的这一技术被用于研究蒙古中部(多相 Baga Gazriin 地块)的稀有金属花岗岩、伟晶岩和变质岩。
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Investigation of rare‐metal granites, pegmatites, and metasomatites minerals of Mongolia by scanning electron microscopy and x‐ray electron probe microanalysis methods
The multicomponent technique of x‐ray electron probe microanalysis for rock‐forming and minor minerals of granites, pegmatites, and metasomatites was developed using the scanning electron microscopy (SEM) and x‐ray electron probe microanalysis (EPMA) methods. The conditions for excitation and recording of elements analytical lines were chosen taking into account the properties of the investigated material. The distortion of analytical signal due to the effect of mutual overlapping of determined elements analytical lines was corrected using overlap coefficients, previously determined on the samples that did not contain the determined element. An assessment of metrological characteristics of EPMA technique showed, that it satisfies the requirements for the second category of quality of quantitative determinations and the second category of analyses adopted in the International Program for Professional Testing of Geoanalytical Laboratories (GeoPT). This developed technique was used for studying rare‐metal granites, pegmatites, and metasomatites of Central Mongolia (multiphase Baga Gazriin massif).
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来源期刊
X-Ray Spectrometry
X-Ray Spectrometry 物理-光谱学
CiteScore
3.10
自引率
8.30%
发文量
38
审稿时长
6-12 weeks
期刊介绍: X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources. Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods. Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.
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