利用反射区平板光谱仪在锂 K 范围内进行高分辨率 X 射线发射光谱分析

IF 1.5 4区物理与天体物理 Q3 SPECTROSCOPY X-Ray Spectrometry Pub Date : 2024-04-18 DOI:10.1002/xrs.3427

Khalil Hassebi, Nicolas Rividi, Michel Fialin, Anne Verlaguet, Gaston Godard, Jürgen Probst, Heike Löchel, Thomas Krist, Christoph Braig, Christian Seifert, Rabah Benbalagh, Régis Vacheresse, Vita Ilakovac, Karine Le Guen, Philippe Jonnard

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引用次数: 0

摘要

在电子探针显微分析仪上成功实现了基于反射区板的新开发的 (35-130) eV 软 X 射线范围光谱仪。在此背景下，我们展示了利用该装置获得的第一批光谱，包括 Be (Kα)、C (Kα)、Mg (L2,3)、Al (L2,3) 和 Si (L2,3) 等元素的光谱。我们还对几种锂化合物进行了分析，并测量了金属锂、LiF 和 LiNbO3 的 Li Kα 发射。其中一些结果与密度泛函理论计算结果进行了比较。我们选择了含锂矿物伏锂辉石 Li0.75Na0.25Al(PO4)F0.75(OH)0.25 的光谱来讨论所面临的一些挑战。

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High‐resolution x‐ray emission spectrometry in the lithium K range with a reflection zone plate spectrometer

Implementing a newly developed spectrometer for the soft x‐ray range of (35–130) eV based on reflection zone plates was successfully accomplished on an electron probe microanalyzer. In this context, we present the first spectra acquired using this setup, including those of elements such as Be (Kα), C (Kα), Mg (L2,3), Al (L2,3), and Si (L2,3). We have also conducted an analysis of several lithium compounds and measured the emission of Li Kα from metallic Li, LiF, and LiNbO3. Some of the results were compared with density functional theory calculations. The spectrum obtained for the lithium‐bearing mineral amblygonite Li0.75Na0.25Al(PO4)F0.75(OH)0.25 is chosen to discuss some of the challenges faced.

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来源期刊

X-Ray Spectrometry 物理-光谱学

CiteScore

3.10

自引率

8.30%

发文量

审稿时长

6-12 weeks

期刊介绍： X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources. Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods. Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.