{"title":"电致伸缩薄膜的形态稳定性","authors":"Jin Zhang, Peter W. Voorhees","doi":"10.1016/j.ijengsci.2024.104073","DOIUrl":null,"url":null,"abstract":"<div><p>A large electric field is typically present in anodic or passive oxide films. Stresses induced by such a large electric field are critical in understanding the breakdown mechanism of thin oxide films and improving their corrosion resistance. In this work, we consider electromechanical coupling through the electrostrictive effect. A continuum model incorporating lattice misfit and electric field-induced stresses is developed. We perform a linear stability analysis of the full coupled model and show that, for typical oxides, neglecting electrostriction underestimates the film’s instability, especially in systems with a large electric field. Moreover, a region where electrostriction can potentially provide a stabilizing effect is identified, allowing electrostriction to enhance corrosion resistance. We identified an equilibrium electric field intrinsic to the system and the corresponding equilibrium film thickness. The film’s stability is very sensitive to the electric field: a 40 percent deviation from the equilibrium electric field can change the maximum growth rate by nearly an order of magnitude. Moreover, our model reduces to classical morphological instability models in the limit of misfit-only, electrostatic-only, and no-electrostriction cases. Finally, the effect of various parameters on the film’s stability is studied.</p></div>","PeriodicalId":14053,"journal":{"name":"International Journal of Engineering Science","volume":null,"pages":null},"PeriodicalIF":5.7000,"publicationDate":"2024-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Morphological stability of electrostrictive thin films\",\"authors\":\"Jin Zhang, Peter W. Voorhees\",\"doi\":\"10.1016/j.ijengsci.2024.104073\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>A large electric field is typically present in anodic or passive oxide films. Stresses induced by such a large electric field are critical in understanding the breakdown mechanism of thin oxide films and improving their corrosion resistance. In this work, we consider electromechanical coupling through the electrostrictive effect. A continuum model incorporating lattice misfit and electric field-induced stresses is developed. We perform a linear stability analysis of the full coupled model and show that, for typical oxides, neglecting electrostriction underestimates the film’s instability, especially in systems with a large electric field. Moreover, a region where electrostriction can potentially provide a stabilizing effect is identified, allowing electrostriction to enhance corrosion resistance. We identified an equilibrium electric field intrinsic to the system and the corresponding equilibrium film thickness. The film’s stability is very sensitive to the electric field: a 40 percent deviation from the equilibrium electric field can change the maximum growth rate by nearly an order of magnitude. Moreover, our model reduces to classical morphological instability models in the limit of misfit-only, electrostatic-only, and no-electrostriction cases. Finally, the effect of various parameters on the film’s stability is studied.</p></div>\",\"PeriodicalId\":14053,\"journal\":{\"name\":\"International Journal of Engineering Science\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":5.7000,\"publicationDate\":\"2024-04-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Engineering Science\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0020722524000570\",\"RegionNum\":1,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Engineering Science","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0020722524000570","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, MULTIDISCIPLINARY","Score":null,"Total":0}
Morphological stability of electrostrictive thin films
A large electric field is typically present in anodic or passive oxide films. Stresses induced by such a large electric field are critical in understanding the breakdown mechanism of thin oxide films and improving their corrosion resistance. In this work, we consider electromechanical coupling through the electrostrictive effect. A continuum model incorporating lattice misfit and electric field-induced stresses is developed. We perform a linear stability analysis of the full coupled model and show that, for typical oxides, neglecting electrostriction underestimates the film’s instability, especially in systems with a large electric field. Moreover, a region where electrostriction can potentially provide a stabilizing effect is identified, allowing electrostriction to enhance corrosion resistance. We identified an equilibrium electric field intrinsic to the system and the corresponding equilibrium film thickness. The film’s stability is very sensitive to the electric field: a 40 percent deviation from the equilibrium electric field can change the maximum growth rate by nearly an order of magnitude. Moreover, our model reduces to classical morphological instability models in the limit of misfit-only, electrostatic-only, and no-electrostriction cases. Finally, the effect of various parameters on the film’s stability is studied.
期刊介绍:
The International Journal of Engineering Science is not limited to a specific aspect of science and engineering but is instead devoted to a wide range of subfields in the engineering sciences. While it encourages a broad spectrum of contribution in the engineering sciences, its core interest lies in issues concerning material modeling and response. Articles of interdisciplinary nature are particularly welcome.
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