以泄漏电流探究绝缘复合聚合物中的载流子传输机理

M. M. Mamun, Amar Mavinkurve, Michiel van Soestbergen, Greta Terzariol, Muhammad A. Alam
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引用次数: 0

摘要

无定形复合聚合物具有高介电强度、机械坚固性和热稳定性,因此被广泛用作微电子领域的绝缘体。然而,有机-无机复合材料系统由于漏电流(JTot)而性能不佳,并加速退化。遗憾的是,人们对 JTot 的基本机理及其成分(如离子和电子成分)了解不足,尤其是在极端使用条件下(如高湿度和高温)。在本研究中,我们使用数值模拟和实验 JTot 数据(在含有二氧化硅填料的无定形环氧聚合物中)来 (i) 统一复合聚合物中 JTot 的静电模型,(ii) 说明 JTot 的早期部分(即、外部电流)主要是由金属接触附近与离子传输/定位(Jion)相关的图像电荷引起的;(iii) 证明了累积的反离子(通过带弯曲)降低了电子电荷注入的障碍,并促进了来自金属的电子注入(Jelec);以及 (iv) 通过利用 Jion,为复合绝缘体的原位离子传输表征提供了一种算法。这项工作提供了有关泄漏电流机制的新见解,以及如何将其用作复合材料复杂输运机制的探针。
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Leakage current as a probe into the mechanics of carrier transport in insulating composite polymers
Amorphous composite polymers are widely used as insulators in microelectronics due to their high dielectric strength, mechanical robustness, and thermal stability. However, organic–inorganic composite systems suffer from undesirable performance and accelerated degradation due to leakage current (JTot). Unfortunately, the underlying mechanism of JTot and its components (e.g., ionic and electronic constituents) are inadequately understood, particularly in extreme use conditions (e.g., high humidity and temperature). In this study, we use numerical simulation and experimental JTot data (in amorphous epoxy polymer with silica fillers) to (i) unify the electrostatic model for JTot in composite polymers, (ii) illustrate that the early part of JTot (i.e., external current) is primarily due to the image charge associated with ion transport/ localization (Jion) near the metallic contacts, (iii) demonstrate that the accumulated counter-ions reduce the barrier for electronic charge injection (by band bending) and facilitate electronic injection from the metals (Jelec), and (iv) provide an algorithm for the in situ ion transport characterization of composite insulators by exploiting Jion. This work provides new insights regarding the leakage current mechanism and how it can be used as a probe into the complex transport mechanisms of the composite material.
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